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LabVIEW-based contact resistance test system

A test system and contact resistance technology, applied in the direction of measuring resistance/reactance/impedance, measuring device, measuring electrical variables, etc., can solve the problem of inconvenient volume test of chip resistors, reduce system complexity and cost, and improve efficiency Effect

Pending Publication Date: 2021-08-06
西安子国微科技有限公司
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  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

With the development of surface mount technology, chip resistors gradually replace lead resistors, and chip resistors are inconvenient to test due to their small size

Method used

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  • LabVIEW-based contact resistance test system
  • LabVIEW-based contact resistance test system
  • LabVIEW-based contact resistance test system

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Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] see Figure 1-3 , the present invention provides a technical solution: a contact resistance testing system based on LabVIEW, comprising a contact resistance testing system 1, the contact resistance testing system 1 is provided with a test board 2 and a test system 15, and the test board 2 is provided with Control switch 5, AD collector 4, constant current source 3, control switch 5, AD collector 4, constant current source 3 are respectively connected to...

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Abstract

The invention discloses a LabVIEW-based contact resistance test system, which comprises a contact resistance test system, a test board card and a test system are arranged on the contact resistance test system, and a constant current source, an AD collector, a control switch and an RS232 interface are arranged on the test board card. The test system is provided with an RS232 interface, a CPU, a window communication module, a test controller, a database memory, a data processor and a display module, the edge of one side of the test system is provided with a VGA interface, a USB interface and an RJ45 interface, the VGA interface is connected with a liquid crystal screen, the USB interface is connected with a keyboard and a mouse, and the test system has the functions of real-time monitoring, calculation, analysis and display, and also has the real-time data storage capability. Compared with a common test method, the test efficiency, stability and accuracy are greatly improved, and the system complexity and cost are greatly reduced.

Description

technical field [0001] The invention relates to the technical field of industrial relay testing, in particular to a contact resistance testing system based on LabVIEW. Background technique [0002] The reliability of electronic products is fundamentally determined by the quality of components. Resistors are one of the most widely used components, and their testing work has begun to be standardized. "GB / T 5729-2003 Fixed Resistors for Electronic Equipment" and " The component standards of Q / GDW11179.3 Electric Energy Meter Components Technical Specifications Part 3: Resistors clearly stipulate the testing methods of resistors. With the development of surface mount technology, chip resistors gradually replace lead resistors, and chip resistors are inconvenient for testing due to their small size. Contents of the invention [0003] The object of the present invention is to provide a contact resistance testing system based on LabVIEW to solve the problems raised in the backgr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02
CPCG01R27/02
Inventor 朱文博郭奇王江涛石建华孙舟蔡佳欣陶思宇
Owner 西安子国微科技有限公司
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