Fourier transform spectrometer

A Fourier transform and spectrometer technology, applied in the field of spectral measurement, can solve problems such as restricting applications, increasing the volume and weight of the instrument, and achieving the effects of reducing the difficulty of adjustment and calibration, reducing manufacturing costs, and being easy to manufacture.

Active Publication Date: 2021-08-20
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

However, due to the high-precision moving mirror scanning mechanism and the precise reference light source sampling control system, the volume and weight of the

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  • Fourier transform spectrometer
  • Fourier transform spectrometer
  • Fourier transform spectrometer

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[0044] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0045] The object of the present invention is to provide a Fourier transform spectrometer, which uses a double diffraction grating or a double prism grating for dispersion compensation, can maximize the use of the energy of incident light, and realizes light and miniaturization of the spectrometer. A Fourier transform spectrometer provided by the present invention will be described in detail below through specific embodiments.

[0046] refer to figure 1As shown in the optical path diagram of Fourier spectrometer using diffraction grating for dispersion, after the parallel light enters...

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Abstract

The invention provides a Fourier transform spectrometer. Spectrum segmentation is realized by utilizing a double-grating system in one dimension, so that an optical axis is not folded, the adjustment and correction difficulty of each element of the system is reduced, and the complexity of the system is reduced. In another dimension, band-pass sampling is realized by utilizing a spatial modulation interference system, so that the cross coupling modulation of chromatic dispersion and interference of an incident light field is realized in two orthogonal directions. A narrow slit and a large array refrigeration detector which need to be adopted by a chromatic dispersion spectrometer for realizing infrared high spectral resolution are avoided, the limitation of a core device is eliminated, and relatively high luminous flux and signal-to-noise ratio are achieved; meanwhile, a static structure is adopted, manufacturing and control difficulties caused by moving parts are avoided, and the reliability, the stability and the real-time performance are better; and a measurement mechanism of spectrum segmentation and band-pass sampling is adopted, so that the contradiction of mutual restriction between the spectrum bandwidth and the spectrum resolution is solved.

Description

technical field [0001] The invention belongs to the technical field of spectrum measurement, and in particular relates to a Fourier transform spectrometer based on double-grating diffraction interference quadrature coupling modulation. Background technique [0002] With the progress of society and the development of science and technology, infrared spectroscopy has been widely used in physics, chemistry, life, geology, medicine and other fields, and has played an important role in the exploration and discovery of new materials, new energy and the unknown world. effect. In recent years, with the emergence and development of high-tech fields such as meteorological observation, environmental monitoring, space remote sensing detection, and military ground object reconnaissance and analysis, due to its special application environment and conditions of use, the infrared spectrum detection technology and instruments in terms of volume and performance put forward higher requirement...

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Application Information

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IPC IPC(8): G01J3/02G01J3/45G01N21/01G01N21/27
CPCG01J3/0205G01J3/45G01N21/01G01N21/27
Inventor 吕金光梁静秋王惟彪秦余欣陶金
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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