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3D structured light measurement method and device

A measurement method and a technology of a measurement device, applied in the field of 3D structured light, can solve the problems of weakening the brightness and clarity of the light spot, and decreasing the accuracy of spatial position information, so as to achieve the effect of avoiding interference

Pending Publication Date: 2021-08-31
深圳博升光电科技有限公司
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AI Technical Summary

Problems solved by technology

[0003] In the related art, the device using 3D structured light technology, in the natural strong light environment, the light spot emitted by its transmitter is easily covered, resulting in weakened brightness and clarity of the light spot collected by its receiver, which in turn leads to its The accuracy of the spatial position information calculated by the arithmetic unit decreases

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  • 3D structured light measurement method and device
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  • 3D structured light measurement method and device

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Embodiment Construction

[0039] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for ease of description, only parts related to the invention are shown in the drawings.

[0040] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0041] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein and in the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the cont...

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Abstract

The invention discloses a 3D structured light measurement method and device. The 3D structured light measurement method comprises the following steps: acquiring a first speckle pattern and a second speckle pattern; according to a definition parameter and a brightness parameter, synthesizing a first light spot at a preset position in the first speckle pattern and a second light spot at a preset position in the second speckle pattern to obtain a third light spot at a preset position in a third speckle pattern; and obtaining the position information of the target object by using a third light spot in the third speckle pattern. According to the invention, the definition parameter and the brightness parameter serve as synthesis processing rules, the first light spot and the second light spot are synthesized to obtain the third light spot, the spatial position information of the target object is obtained according to the third light spot, interference of natural light on the spatial position information is avoided, and accurate spatial position information can be obtained.

Description

technical field [0001] The present invention generally relates to the technical field of 3D structured light, and in particular to a method and device for measuring 3D structured light. Background technique [0002] With the development of science and technology, traditional 2D measurement methods are difficult to meet the requirements of spatial position information and high measurement accuracy. Coupled with the continuous rise of the artificial intelligence industry in modern society, the requirements for real-time and remoteness of measurement technology are put forward, and the defects of traditional 2D measurement are becoming more and more prominent. 3D measurement technology, especially 3D structured light technology, is widely used due to its advantages of high precision, low cost, and low power consumption. [0003] In the related art, the device using 3D structured light technology, in the natural strong light environment, the light spot emitted by the transmitte...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C3/02
CPCG01C3/02
Inventor 金玮余建男张阳王百顺
Owner 深圳博升光电科技有限公司
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