LEU test bench system and test method and calibration method thereof
A technology of test bench and test box, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., and can solve the problem of less functions of LEU test benches
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[0028] Combine below Figure 1-6 The present invention is further described, but the protection scope of the present invention is not limited to the content.
[0029] For the sake of clarity, not all features of an actual embodiment are described. In the following description, well-known functions and constructions are not described in detail since they would obscure the invention with unnecessary detail and should be considered in the development of any actual embodiment. , a great deal of implementation detail must be worked out to achieve the developer's specific goals, such as changing from one embodiment to another in accordance with system-related or business-related constraints, and it should also be recognized that such development work may be complex and time-consuming Yes, but just routine work for those skilled in the art.
[0030] A LEU test bench system, which is composed of a computer and a test box, the test box is equipped with an ARM processor, an interface S...
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