Single-photon counting system for measuring weak luminescence of dielectric medium
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- XI AN JIAOTONG UNIV
- Publication Date
- 2012-07-04
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Abstract
Description
technical field
[0001] The invention belongs to the research field of dielectric aging characteristics in electrical insulation technology, and in particular relates to a counting system for measuring weak luminescence of dielectrics. Background technique
[0002] Dielectric materials are an essential part of almost all electrical and electronic systems, used to achieve electrical insulation and mechanical fixation of charged bodies. Under the action of an electric field, the dielectric will gradually age and produce partial discharge. Recent studies have shown that the dielectric will have a weak luminescence before partial discharge. Therefore, the weak luminescence is closely related to the initial stage of dielectric aging.
[0003] Because the weak luminescence of the dielectric is different from the luminescence of the weak light-emitting device, its luminous intensity is very weak, usually expressed by the number of photons. Therefore, single-photon detection technolo...