Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Single-photon counting system for measuring weak luminescence of dielectric medium

A technology of single-photon counting and luminescence measurement, which is applied in optical radiation measurement, measuring devices, photometry, etc., can solve the problem that data storage capacity and anti-interference performance cannot meet the requirements of accurate collection and storage of large amounts of data, reduction of equipment volume, photon Counting equipment is expensive and other problems, to achieve the effect of good communication rate, simplified circuit design, and easy production and debugging

Active Publication Date: 2012-07-04
XI AN JIAOTONG UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the high price of photon counting equipment in the research of weak luminescence of existing polymers, and the data storage capacity and anti-interference performance cannot meet the needs of real-time and accurate collection and storage of a large amount of data, the purpose of this invention is to propose a method for the measurement of weak luminescence of dielectrics Counting system, which uses a programmable logic gate array module to complete the complex control circuit in one chip, which can not only reduce the size of the device, but also meet the needs of polymer weak luminescence photon measurement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Single-photon counting system for measuring weak luminescence of dielectric medium
  • Single-photon counting system for measuring weak luminescence of dielectric medium
  • Single-photon counting system for measuring weak luminescence of dielectric medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] The content of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0024] figure 1 A block diagram of the single photon counting system. It includes a single photon photoelectric conversion module 100 , a pulse input signal photoelectric isolation module 101 , a pulse signal output module 102 , an external trigger signal acquisition module 103 , a trigger threshold adjustment module 104 , a programmable logic gate array module 105 and a PCI interface module 106 . Except for the single photon photoelectric conversion module 100, other modules are integrated into a PCI board. The connections between the modules are as follows:

[0025] The pulse signal output by the single photon photoelectric conversion module 100 is connected to the I / O input terminal 110 of the programmable logic gate array module 105 through the output terminal of the input signal photoelectric isolation module 101, and the input terminal ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a single-photon counting system for measuring weak luminescence of a dielectric medium, comprising a single-photon photoelectric converting module, an input signal photoelectric separating module, a pulse signal output module, an external triggering signal collecting module, a triggering threshold adjusting module, a field programmable gate array (FPGA) module and a peripheral component interconnect (PCI) interface module. In the system, theFPGA module is adopted, so that the complex control circuit is mounted in one chip, the volume of the device is reduced and the design of the circuit is simplified, thereby being convenient for producing and debugging; and simultaneously, in the system, the PCI interface and PC (personal computer) are adopted to transfer the data so as to satisfy the requirements for measuring the weak luminescence of polymers by means of the excellent communication speed and interference resistance of the PCI interface.

Description

technical field [0001] The invention belongs to the research field of dielectric aging characteristics in electrical insulation technology, and in particular relates to a counting system for measuring weak luminescence of dielectrics. Background technique [0002] Dielectric materials are an essential part of almost all electrical and electronic systems, used to achieve electrical insulation and mechanical fixation of charged bodies. Under the action of an electric field, the dielectric will gradually age and produce partial discharge. Recent studies have shown that the dielectric will have a weak luminescence before partial discharge. Therefore, the weak luminescence is closely related to the initial stage of dielectric aging. [0003] Because the weak luminescence of the dielectric is different from the luminescence of the weak light-emitting device, its luminous intensity is very weak, usually expressed by the number of photons. Therefore, single-photon detection technolo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00G01R31/14
CPCG01N21/64G01J2001/442H03K21/023
Inventor 张冠军穆海宝郭一欣
Owner XI AN JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products