Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

1results about How to "Easy production and debugging" patented technology

An active linear array automatic test device

This application belongs to the field of automatic testing technology for active linear arrays. This application provides an automatic testing device for active linear arrays. In the embodiments disclosed herein, the inputs and outputs of the active linear array under test are connected to an instrumentation unit via an RF switch matrix. A computer controls the RF switch matrix to switch measurement channels, switches the operating state of the active linear array via a product adapter unit, and sets and controls the instrumentation unit to perform measurements and read test data via a network connection. During the test, the device judges whether the test results meet the specifications. This device uses a multi-channel RF switch matrix, replacing traditional manual switching tests with automated testing via electronic switch switching. This not only greatly improves the testing speed but also ensures stable and reliable performance, high accuracy and repeatability, and low equipment wear. It improves the production debugging and acceptance methods of subsystems, significantly increasing the efficiency of production debugging and acceptance.
Owner:CNGC INST NO 206 OF CHINA ARMS IND GRP