This application belongs to the field of
automatic testing technology for active
linear arrays. This application provides an
automatic testing device for active
linear arrays. In the embodiments disclosed herein, the inputs and outputs of the active
linear array under test are connected to an
instrumentation unit via an
RF switch matrix. A computer controls the
RF switch matrix to switch measurement channels, switches the operating state of the active
linear array via a product adapter unit, and sets and controls the
instrumentation unit to perform measurements and read
test data via a
network connection. During the test, the device judges whether the test results meet the specifications. This device uses a multi-channel
RF switch matrix, replacing traditional manual switching tests with automated testing via
electronic switch switching. This not only greatly improves the testing speed but also ensures stable and reliable performance, high accuracy and
repeatability, and low equipment wear. It improves the production debugging and acceptance methods of subsystems, significantly increasing the efficiency of production debugging and acceptance.