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Digital phase-sensitive detector for intelligent element parameter tester

A digital phase-sensitive detection and component parameter technology, which is used in single semiconductor device testing, instruments, semiconductor/solid-state device testing/measurement, etc., can solve the problems of unsuitable broadband measurement and limited bandwidth, etc. The effect of debugging, simplified intermediate links, and simplified circuit

Inactive Publication Date: 2006-09-27
南京长盛仪器有限公司
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Problems solved by technology

However, due to the limited bandwidth of the product DAC, and its word length is generally below 12 bits, the application range of this type of phase-sensitive detector is below 100KHz, which is not suitable for wide-band measurement

Method used

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  • Digital phase-sensitive detector for intelligent element parameter tester
  • Digital phase-sensitive detector for intelligent element parameter tester
  • Digital phase-sensitive detector for intelligent element parameter tester

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Embodiment Construction

[0045] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0046] Such as Figure 4-13 shown.

[0047] A digital phase-sensitive detector for an intelligent component parameter tester, which consists of two anti-aliasing filters 1 with identical parameters, two sample / hold devices 2, a high-speed analog-to-digital converter 3, and a digital phase-sensitive detection algorithm module 4 , time base generator 5 and Field Programmable Gate Array FPGA6, such as Figure 4 As shown, the input of the two-way anti-aliasing filter 1 is respectively connected to the voltage and current signals of the component under test through the two-way signal conditioning circuit 7 in the intelligent component parameter tester, wherein the signal conditioning circuit 7 is a conventional conditioning circuit for Realize the filtering, attenuation and amplification of the signal under test. The outputs of the two anti-aliasing filter...

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Abstract

This invention relates to a digital phase-sensitive detector for intelligent element parameter tester. Wherein, connecting inputs and outputs of anti-confusion filter to the target element voltage and current signals and signal inputs of two-way sample / holder respectively; connecting the trigger input ports and outputs of sample / holder to the outputs of the time-base generator and signal input ports of high-speed ADC respectively; connecting the output signal of the ADC to the opposite signal data ports of digital phase-sensitive detection algorithm module in series or by parallel; connecting the control port and data wire of FPGA to the opposite orts of ADC; and connecting the output of algorithm module with the main controller in the tester.

Description

technical field [0001] The invention relates to a parameter tester for electronic components, in particular to a digital phase-sensitive detector used in a tester with a digital phase-sensitive detector, in particular to a digital phase-sensitive detector for an intelligent component parameter tester. Geophone. Background technique [0002] At present, electronic components (L, C, R semiconductor discrete components and integrated circuits) are the basic material basis of electronic machines, equipment and systems. Their performance, quality and reliability directly affect the quality of electronic equipment, and even play a decisive role. Therefore, the measurement of electronic components is one of the most basic and widely used electronic measurement techniques. [0003] The development of component parameter measuring instruments can be traced back to the 19th century. In 1843, Whiston used a bridge circuit to realize the DC measurement of resistance, which was called...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02G01R31/00G01R31/26G01R31/28G01R13/02H01L21/66
Inventor 王晓俊
Owner 南京长盛仪器有限公司
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