Semiconductor chip test bench

A chip testing and semiconductor technology, which is applied in the field of semiconductor chip testing, can solve the problems of semiconductor chip wear, test accuracy deviation, etc., and achieve the effect of meeting diversified testing requirements

Pending Publication Date: 2021-09-03
上海柯舜科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the process of testing semiconductor chips, the probes are usually fixed, and the inspector adjusts the position of the semiconductor chip on the test bench to adapt to the probes to obtain relevant test data. Due to the high processing accuracy of semiconductor chips, Repeatedly adjusting the position of the semiconductor chip will cause wear and tear on the semiconductor chip, resulting in deviations in test accuracy

Method used

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  • Semiconductor chip test bench
  • Semiconductor chip test bench
  • Semiconductor chip test bench

Examples

Experimental program
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Embodiment Construction

[0035] The following is attached Figure 1-6 The application is described in further detail.

[0036] The embodiment of the present application discloses a semiconductor chip test bench

[0037] refer to figure 1 and figure 2 , a semiconductor chip test bench includes a base plate 1, the upper end of the base plate 1 is provided with a mounting frame 2 and a placement table 3 for placing semiconductor chips, the mounting frame 2 can slide on the base plate 1, and the mounting frame 3 is fixedly connected to the mounting frame 2 And the placement table 3 is arranged along the horizontal direction, and the base plate 1 is also provided with a microscope 4 for assisting in placing semiconductor chips and a display screen 5 for displaying relevant parameters of the semiconductor chip, and the base plate 1 is fixedly connected with two probe holder brackets 6 , two probe base brackets 6 are arranged symmetrically with respect to the center line of the base plate 1 along the wid...

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Abstract

The invention relates to the field of semiconductor chip detection, and particularly discloses a semiconductor chip test bench. The test bench comprises a bottom plate, and the upper end of the bottom plate is provided with a placement table used for supporting a semiconductor chip, a microscope used for assisting observation and a display screen used for displaying related parameters; the placement table is connected with the bottom plate and is arranged in the horizontal direction, the microscope and the display screen are both movably connected with the bottom plate, the upper end of the bottom plate is also provided with a probe for applying current to the semiconductor chip, the upper end of the bottom plate is provided with a probe seat assembly, the probe seat assembly is used for driving the probe to move along the three-coordinate direction, and the placement table is movably connected with the bottom plate. According to the invention, the test precision of the semiconductor chip can be improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor chip detection, in particular to a semiconductor chip testing platform. Background technique [0002] With the rapid development of the economy, semiconductor chips play an extremely important role in many fields, such as data centers, mobile broadband, the Internet, and defense and military industries. The application of semiconductor chips is ubiquitous. In order to meet people's different application needs, adapt In different working environments, the performance reliability of semiconductor chips directly affects the quality, stability and time limit of signal transmission. [0003] When performing a performance test on a semiconductor chip, the Hall effect is usually used to test the relevant performance parameters of the semiconductor chip, that is, to test the relevant parameters of the semiconductor chip by applying a current to the semiconductor chip. Generally, in the process of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
CPCG01R31/2886G01R31/2851G01R1/04G01R1/0416
Inventor 黄晓婷黄伟
Owner 上海柯舜科技有限公司
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