Method for automatically adapting correction coefficient of alternating parallel sampling system under variable temperature condition

Abstract

The invention discloses a method for automatically adapting a correction coefficient under a variable temperature condition of an alternating parallel sampling system in the field of waveform digitization. The method comprises the following steps of: 1, pre-acquiring a channel mismatch error calibration result under an input signal frequency corresponding to each single frequency point signal in a frequency band range at different temperatures; 2, according to the current environment temperature, linear interpolation being carried out on a mismatch error calibration result obtained in advance, and obtaining a mismatch error coefficient at the current temperature; and 3, calculating a correction coefficient corresponding to the adaptive error coefficient at the current temperature through hardware logic, and correcting a test result at the current temperature in real time. According to the method, the TIADC system is corrected by using the correction parameters subjected to temperature adaptation, so that the broadband dynamic performance of the system under variable temperature can be basically kept unchanged, and the TIADC can adapt to a variable-temperature working environment. Besides, the calibration process is automatically realized through hardware, the calibration efficiency is effectively improved, and convenience is provided for multi-channel application of the TIADC system.

Description

technical field [0001] The invention relates to the field of waveform digitization, in particular to an automatic adaptation method of correction coefficients under variable temperature conditions of an alternate parallel sampling system. Background technique [0002] Waveform digitization technology is a hot spot in the field of high-speed signal measurement. One of the methods is to directly sample the waveform in real time through a high-speed analog-to-digital converter (Analog-to-Digital Converter, ADC). Such as figure 1 As shown, in the waveform digitization system, the parallel alternate sampling (TIADC) technology can make the system sampling rate break through the ADC sampling rate limit, by arranging the sampling moments of M ADCs with a sampling rate of Fs at equal intervals of 1 / (MFs) Then, a waveform digital system with an equivalent sampling rate of MFs can be obtained. [0003] In the TIADC system, there are inconsistencies between different ADCs; this incon...

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Problems solved by technology

like image 3 As shown, if the correction parameters at room temperature (25 °C) are used to correct the sampling results at 0 °C, the effective bit performance is about 1 bit different from the system performance after mismatch error correction at room temperature

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