Signal high-frequency oscillation characteristic processing method

A processing method, high-frequency oscillation technology, applied in the field of processing

Active Publication Date: 2021-09-07
山东阅芯电子科技有限公司
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the field of detection, it is necessary to ensure the authenticity of the signal waveform and give consistent and specific quantitative parameters, which has always been a difficult problem in the processing of oscillating signal waveforms.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Signal high-frequency oscillation characteristic processing method
  • Signal high-frequency oscillation characteristic processing method
  • Signal high-frequency oscillation characteristic processing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The present invention will be further described below in conjunction with specific drawings and embodiments.

[0027] As shown in the figure: In order to improve the authenticity, flexibility, rigor and reliability of the waveform analysis process, and at the same time adapt to the unforeseen oscillation interference of the waveform, it can continue to carry out practical and effective trends for high-frequency oscillations with varying degrees of complexity. Extract, processing method of the present invention comprises the steps:

[0028] Step 1. Provide a knowledge base, store several oscillation solutions in the knowledge base, wherein each oscillation solution includes signal acquisition object name, waveform condition, effective signal frequency, acquisition frequency, acquisition accuracy, acquisition length, standard waveform And the corresponding oscillating signal processing method;

[0029] Specifically, the knowledge base may be in the form of an existing da...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a signal high-frequency oscillation characteristic processing method. The method comprises the following steps: step 1, storing an oscillation solution in a knowledge base; step 2, for a signal to be processed, when a matched oscillation solution is searched in the knowledge base, skipping to step 3, otherwise, skipping to step 4; step 3, processing the to-be-processed signal by using the searched oscillation solution, generating a processing report and skipping to step 6; 4, obtaining a standard waveform, and obtaining the waveform characteristics of the waveform to be processed according to the corresponding standard waveform; step 5, determining an oscillation signal processing method of the to-be-processed signal according to the determined waveform characteristics of the to-be-processed signal; and step 6, ending. According to the method, the authenticity, flexibility, leakproofness and reliability of the waveform analysis process can be improved. Meanwhile, the method adapts to unpredictable oscillation interference of the waveform, and practical and effective trend extraction can be continuously carried out on high-frequency oscillation of which the complexity degree is changed.

Description

technical field [0001] The invention relates to a processing method, in particular to a signal high-frequency oscillation characteristic processing method. Background technique [0002] With the wide application and rapid development of the semiconductor industry, semiconductor switching devices are gradually enriched, and the dynamic requirements for high load, fast response, and low power consumption are also increasing; for testing equipment, "batch, fast, consistent, and real" is also The pressure and challenges faced by the semiconductor testing industry; improving the analysis efficiency of dynamic testing is of great significance for R&D and process improvement. [0003] In the process of R&D and production of semiconductor devices, specific product design needs to be carried out according to the needs and requirements of the product target market, such as core chips, packaging processes, etc. After the product design and production are completed, it is necessary to ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/00H01L21/66
CPCH01L22/14G06F2218/10G06F2218/12
Inventor 邹明珣朱阳军张文亮雷小阳张军辉
Owner 山东阅芯电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products