Method to efficiently evaluate a log pattern

A log and pattern technology, applied in the direction of detecting faulty computer hardware, responding to error generation, fault handling not based on redundancy, etc., can solve problems such as limited diagnostic value of log pattern and adverse effects of effectiveness

Pending Publication Date: 2021-09-14
KONINKLJIJKE PHILIPS NV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Log patterns that generate too many alerts can adversely affect the effectiveness of root cause analysis; meanwhile, log patterns that generate too few alerts have limited diagnostic value

Method used

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  • Method to efficiently evaluate a log pattern
  • Method to efficiently evaluate a log pattern
  • Method to efficiently evaluate a log pattern

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Embodiment Construction

[0030] Evaluating the performance of log mode using historical data requires applying log mode to log event data generated by many previous calls. For example, consider the pedestal that houses thousands of medical imaging systems that experience a total of 10,000 service calls per year. Let's say the log pattern hits 100 service calls per year, or 1% of all service calls. Evaluating the performance of log mode requires analyzing a large number of service calls. Even analyzing log events for 1,000 random service calls (10% of all service calls) would on average only yield 10 service calls that the log pattern would hit. This is generally insufficient for proper statistical analysis, making this approach difficult or even infeasible in practice. On the other hand, processing all log events for all 10,000 service calls would result in 100 service calls that the log pattern would hit. This may be sufficient for statistical analysis, however, the computational resources require...

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Abstract

A non-transitory computer-readable medium stores instructions readable and executable by at least one electronic processor (10, 12, 14) to perform a log pattern analysis method (300) by applying a log pattern to log data undergoing analysis comprising log events which are time stamped and which are defined by values for a set of fields. The log data undergoing analysis are stored on a server (30) accessible by the at least one electronic processor via an electronic network (31). The log pattern analysis method includes: constructing a retrieval query to select log events that are in a time interval and that also satisfy at least one additional constraint associated with the log pattern and defined on one or more filter fields of the set of fields; downloading a sub-set of the log data undergoing analysis from the server to the at least one electronic processor via the electronic network, wherein the sub-set is selected from the log data undergoing analysis by the retrieval query; applying the log pattern to the downloaded sub-set of the log data undergoing analysis to identify log pattern hits in the log data undergoing analysis; and controlling a display screen (16) to display a report of the log pattern hits in the log data undergoing analysis.

Description

technical field [0001] The following generally relates to medical imaging equipment maintenance technology, fault diagnosis technology, log mode detection technology and related technologies. Background technique [0002] Medical imaging systems such as Magnetic Resonance Imaging (MRI), Transmission Computed Tomography (CT), and Intraoperative X-ray (iXR) scanners occasionally experience system failures that, in some cases, can be resolved by a Remote Service Engineer (RSE) The system is malfunctioning. More often, however, a Field Service Engineer (FSE) must visit the hospital to resolve the problem. Especially when replacement parts are needed, FSE visits to hospitals are unavoidable. Depending on whether the root cause of a system failure can be determined remotely, multiple FSE visits may be required to resolve the issue when required parts are not available during the first visit. During the first visit, the FSE determines the root cause of the problem and determines...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/07G06F11/32G06F11/22
CPCG06F11/0778G06F11/079G06F11/321G06F11/2294G06F11/0733G06F11/0706G06F11/0775G06F11/0784G06F11/3003G06F11/3013G06F11/3075G06F11/3082G06F2201/835
Inventor S·P·P·普龙克J·H·M·科斯特M·巴比里
Owner KONINKLJIJKE PHILIPS NV
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