Supercritical carbon dioxide silicon block cleaning device and silicon block processing system and method

A carbon dioxide and treatment method technology, applied in chemical instruments and methods, cleaning methods and utensils, electrical components, etc., can solve problems such as failure of crystal pulling, excessive impurities on the surface of silicon blocks, and difficult process control.

Active Publication Date: 2021-09-24
江苏鑫华半导体科技股份有限公司
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The products produced in the reduction furnace are polysilicon rods, which cannot be directly drawn by downstream silicon wafer customers. They need to be crushed into polysilicon blocks of appropriate size, but trace impurities are easily introduced during the crushing process. Compared with The ultra-high purity requirements of the polysilicon body are unacceptable, so the surface needs to be cleaned
[0003] The commonly used cleaning methods use various acids or mixed acids to etch the surface of silicon blocks, but in the process of etching, it is easy to cause uneven etching, stains or other surface abnormalities due to the difference in surface microstructure. At the same time, it is easy to make the appearance of the silicon block poor due to the difficulty of process control
In addition, after using acid for surface etching, high-purity water needs to be used for rinsing to clean the acid residue and impurities, and then it needs to be dried. In this process, incomplete rinsing and drying are very likely to occur, making silicon Impurities on the surface of the block exceed the standard, resulting in failure of crystal pulling in downstream applications

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Supercritical carbon dioxide silicon block cleaning device and silicon block processing system and method
  • Supercritical carbon dioxide silicon block cleaning device and silicon block processing system and method
  • Supercritical carbon dioxide silicon block cleaning device and silicon block processing system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0054] Such as figure 1 As shown, a supercritical carbon dioxide silicon block cleaning device includes: a tank body 1, providing a closed space for cleaning silicon blocks, and at least for liquid carbon dioxide and silicon blocks to enter, and for gaseous carbon dioxide and silicon blocks leave; the pressure regulating device 2 adjusts the pressure in the enclosed space to a supercritical pressure higher than carbon dioxide before the silicon block is cleaned, and keeps the pressure constant during the cleaning process; and lowers the pressure in the tank body 1 after the silicon block is cleaned. Pressure, so that carbon dioxide gasification; temperature control device 3, the temperature in the closed space is adjusted to be higher than the supercritical temperature of carbon dioxide before the silicon block is cleaned, and the temperature is kept constant during the cleaning process; The gasified carbon dioxide in the body 1 is compressed to form liquid carbon dioxide; the...

Embodiment 2

[0058] As shown in Fig. 2, a kind of silicon block processing system comprises: two-stage processing unit, each stage processing unit comprises: etching device 6, to the partial impurity etching removal of silicon block; supercritical carbon dioxide silicon block cleaning device 7, The etched silicon block is cleaned.

[0059] Wherein, supercritical carbon dioxide silicon block cleaning device 7 comprises: tank body 1, provides the enclosed space for carrying out silicon block cleaning, and at least for liquid carbon dioxide and silicon block to enter, and, for gaseous carbon dioxide and silicon block to leave; pressure device 2, before the silicon block is cleaned, the pressure in the closed space is adjusted to a supercritical pressure higher than carbon dioxide, and the pressure is kept constant during the cleaning process; and, after the silicon block is cleaned, the pressure in the tank body 1 is reduced, and Make the carbon dioxide vaporize; the temperature control devic...

Embodiment 3

[0062] The difference between this embodiment and the second embodiment is that in order to improve the removal effect of the first-level processing unit on impurities, such as image 3 As shown, the first-level processing unit also includes a water washing device 8, which washes the silicon block from the etching device 6, and the silicon block after water washing is cleaned by supercritical carbon dioxide, so that the removal effect of impurities is further improved. promote.

[0063] In this embodiment, the silicon block does not need to be additionally dried, and the CO 2 Most of the water and acid in the micropores can be washed out, avoiding the residue in the micropores.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the technical field of semiconductor processing, in particular to a supercritical carbon dioxide silicon block cleaning device, which comprises a tank body, providing a closed space for silicon block cleaning; a pressure regulating device, used for regulating the pressure in the closed space to be higher than the supercritical pressure of carbon dioxide before the silicon block is cleaned, and the pressure being kept unchanged in the cleaning process, after the silicon block is cleaned, the pressure in the tank body being reduced, so that the carbon dioxide is gasified; a temperature control device, used for adjusting the temperature in the closed space to be higher than the supercritical temperature of carbon dioxide before the silicon block is cleaned, and the temperature being kept unchanged in the cleaning process; a compression device, used for compressing the gasified carbon dioxide from the tank body to form liquid carbon dioxide; and a carbon dioxide storage tank, used for storing, supplying and recovering liquid carbon dioxide. According to the invention, residues in micropores of the silicon block can be effectively flushed out, so that impurities on the surface of the silicon block are qualified. The invention further provides a silicon block processing system and method.

Description

technical field [0001] The invention relates to the technical field of semiconductor processing, in particular to a supercritical carbon dioxide silicon block cleaning device, a silicon block processing system and a method. Background technique [0002] Electronic-grade polysilicon is the basic raw material of the integrated circuit industry. In order to ensure high purity, the improved Siemens method is generally used to remove impurities from the liquid raw material trichlorosilane through rectification and other purification methods, and then produce it through chemical vapor deposition in the reduction furnace. . The products produced in the reduction furnace are polysilicon rods, which cannot be directly drawn by downstream silicon wafer customers. They need to be crushed into polysilicon blocks of appropriate size, but trace impurities are easily introduced during the crushing process. Compared with The ultra-high purity requirements of the polysilicon body are unacce...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/67H01L21/02B08B7/00
CPCH01L21/67057H01L21/67086H01L21/02079H01L21/02032H01L21/02019H01L21/02101B08B7/0021
Inventor 吴锋田新孙江桥吴鹏
Owner 江苏鑫华半导体科技股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products