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Method and system for cleaning wafers

A wafer cleaning and wafer technology, which is applied to cleaning methods and utensils, cleaning methods using liquids, chemical instruments and methods, etc., can solve the problems of difficult to remove stains on the surface of wafers, uneven heating of wafers, and large amount of chemical residues, etc. achieve the effect of reducing water use

Active Publication Date: 2022-08-05
湖南国创同芯科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] In the process of wafer processing, it is necessary to maintain a high degree of cleanliness on the wafer surface. Therefore, the wafer needs to be cleaned first during processing to remove the dust and stains on the wafer surface. At present, when cleaning the wafer, due to equipment and process difference, it is very easy to cause the stains on the surface of the wafer to be difficult to remove, and the surface of the wafer after immersion in the chemical has a large amount of chemical residue. Only through the traditional ultrasonic cleaning method, it not only consumes a lot of water, but also needs to be cleaned many times. , It takes a long time. After the cleaning is completed, when the wafer is dried, due to the uneven heating position in the oven, it is easy to cause uneven heating of the wafer during drying.

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  • Method and system for cleaning wafers
  • Method and system for cleaning wafers
  • Method and system for cleaning wafers

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Embodiment Construction

[0032] In order to make those skilled in the art better understand the technical solutions of the present invention, the present invention will be described in detail below with reference to the accompanying drawings. The description in this part is only exemplary and explanatory, and should not have any limiting effect on the protection scope of the present invention. .

[0033] Attached to the manual Figure 1-10 As shown, the specific structure of the present invention is: a wafer cleaning method and system, comprising the following steps:

[0034] A. Liquid cleaning: ultrasonically clean the wafer with cleaning liquid to remove dust and stains on the surface of the wafer; the cleaning liquid is KESH203D from Kexi Chemical, and the liquid ratio is 3%; cleaning temperature: 50℃ ;Time:15min;

[0035] B. Rinse with pure water: Use the special rinsing equipment for the wafer to rinse the surface of the wafer to remove the chemical solution and the remaining fine dust and stai...

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Abstract

The invention discloses a wafer cleaning method and system, belonging to the field of wafer cleaning, comprising the following steps: A. Cleaning with medicinal solution: ultrasonically cleaning the wafer with the cleaning medicinal solution to remove fine dust and stains on the surface of the wafer; B. Pure water Rinse: Rinse the surface of the wafer with a special rinsing equipment for the wafer, C. Cavity cleaning: Clear the liquid medicine on the surface of the wafer, D. Ultrasonic pure water, E. High temperature sterilization, F. Wafer baking: Use baking equipment Baking the wafer and cleaning the wafer by rinsing can reduce the use of water, and when the wafer is rinsed with an impinging water flow, the residual chemical solution, dust and stains on the surface of the wafer can be removed more cleanly, When baking the wafer, the wafer can be heated evenly when passing through the heating area by means of self-rotation, so that the wafer can show different motion states in different areas to adapt to the uneven temperature during baking. sex.

Description

technical field [0001] The invention belongs to the field of wafer cleaning, in particular to a wafer cleaning method and system. Background technique [0002] During the processing of the wafer, it is necessary to maintain a high degree of cleanliness on the surface of the wafer. Therefore, the wafer needs to be cleaned first during processing to remove the dust and stains on the surface of the wafer. The difference is that it is very easy to cause the stains on the surface of the wafer to be difficult to remove, and the surface of the wafer after soaking in the chemical has a large amount of chemical residue on the surface. The traditional ultrasonic cleaning method not only consumes a lot of water, but also needs to be cleaned many times. , it takes a long time. After the cleaning is completed, when the wafer is dried, the heating position in the oven is not uniform, which may easily lead to uneven heating of the wafer during drying. SUMMARY OF THE INVENTION [0003] T...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B08B3/02B08B3/12B08B11/00B08B11/02F26B11/18F26B23/04F26B25/02
CPCB08B3/024B08B3/12B08B11/00B08B11/02F26B11/18F26B23/04F26B25/02B08B2203/02
Inventor 解华林
Owner 湖南国创同芯科技有限公司