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Anisotropic etching using photosensitive compound

A compound and etching technology, applied in chemical/electrolytic methods to remove conductive materials, electrical components, printed circuit manufacturing, etc., can solve problems such as inability to form etched structures, low adhesion, fine mask structure barriers, etc.

Pending Publication Date: 2021-10-01
AT & S AUSTRIA TECH & SYSTTECHN AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although copper etch processing is one of the most important steps in the fabrication of printed circuit boards, the processing of copper during fabrication remains a challenging task
in such as figure 1 In the conventional isotropic copper etching process shown in , when a copper film to be etched formed on a substrate and partially covered by a mask (as a negative template for patterning) is etched When used, undercuts may form under the mask due to isotropic etching, resulting in low adhesion
In addition, isotropic etching may not form very fine etched structures, but isotropic etching may be blocked by corresponding fine mask structures

Method used

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  • Anisotropic etching using photosensitive compound
  • Anisotropic etching using photosensitive compound
  • Anisotropic etching using photosensitive compound

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Embodiment Construction

[0093] The illustrations in the figures are schematic. In different figures, similar or identical elements are provided with the same reference signs.

[0094] First, with reference to the accompanying drawings, exemplary embodiments will be described in more detail, and some basic considerations of exemplary embodiments based on the present invention that have been developed will be summarized.

[0095] According to an exemplary embodiment of the present invention, there is provided a method of etching an electrically conductive layer structure during the manufacture of a component carrier, wherein the electrically conductive layer structure is subjected to an etching step in the presence of a photosensitive compound, while at the same time The recess thus formed is irradiated and / or heated for at least a portion of the etching step. The photosensitive composition may respond to irradiation and / or heating in such a way that irradiating and / or heating the photosensitive compo...

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Abstract

The present invention provides a method of etching an electrically conductive layer structure (102) during manufacturing a component carrier (100), wherein the method comprises the steps of: subjecting the electrically conductive layer structure (102) to an etching composition comprising an etchant (106) and a photosensitive compound (108) to thereby form a recess (110) in the electrically conductive layer structure (102); while, at least for a part of time, irradiating and / or heating the recess (110). In addition, an apparatus for etching an electrically conductive layer structure (102) during manufacturing the component carrier (100), an etched electrically conductive layer structure (103) and the component carrier (100) are provided.

Description

technical field [0001] The invention relates to a method for etching an electrically conductive layer structure (hereinafter also referred to simply as "etching process"), a device for etching an electrically conductive layer structure during the manufacture of a component carrier (hereinafter also referred to simply as "etching process"). Etching equipment"), the etched electrically conductive layer structure, and the component carrier. Background technique [0002] The electronic function of a component carrier equipped with one or more components continues to increase, and the miniaturization of such components continues to increase, and components to be mounted on a component carrier such as a printed circuit board (PCB) Against the backdrop of an ever-increasing number of electronic components, increasingly powerful array-like components or packages are being used with multiple contacts or connections, wherein the contacts The interval between is getting smaller and sm...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H05K3/06H05K13/00
CPCH05K3/067H05K3/06H05K13/00H05K3/068H05K2203/0789H05K2203/124H05K2203/122H05K2203/1105H05K2203/1194H05K2203/107H05K3/062
Inventor 约兰塔·克洛采克
Owner AT & S AUSTRIA TECH & SYSTTECHN AG