Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Far-field pattern rapid measurement method based on Fourier interpolation

A measurement method and far-field measurement technology, which is applied in the antenna radiation pattern and other directions, can solve the problems of low far-field test efficiency of the antenna to be tested, no antenna far-field measurement, and low far-field measurement test efficiency, etc., to achieve antenna far-field The direction diagram is accurate, the test efficiency is improved, and the number of sampling points is reduced

Active Publication Date: 2021-10-22
XIDIAN UNIV
View PDF21 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the sampling interval of the far-field test of the existing technology needs to be less than 1 / 10 of the half-power beamwidth of the antenna to be tested. Far-field testing of antennas is inefficient
[0005] The sampling interval of the existing far-field antenna measurement is small, and the test efficiency of the far-field measurement is low. Objectively, there has been no proposal to increase the sampling interval in the antenna far-field measurement, improve the test efficiency, and not affect the far-field pattern of the antenna under test. A quick measure of accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Far-field pattern rapid measurement method based on Fourier interpolation
  • Far-field pattern rapid measurement method based on Fourier interpolation
  • Far-field pattern rapid measurement method based on Fourier interpolation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] In the existing antenna far-field measurement methods, the sampling interval is often required to be less than 1 / 10 of the half-power beamwidth of the antenna to be measured. If the sampling interval is increased, the measured antenna radiation parameters will be inaccurate, resulting in measurement errors; reduce the sampling interval It will also reduce the test efficiency, especially in multi-channel measurement and frequency-sweeping antenna measurement, reducing the sampling interval will significantly reduce the test efficiency. So far, there is no effective solution to the problem of increasing the sampling interval in the antenna far-field measurement without affecting the accuracy of the antenna far-field pattern. Aiming at this problem, the present invention carries out experimental simulation and actual test, and proposes a fast measurement method for far-field pattern based on Fourier interpolation.

[0028] The present invention is a fast measurement method...

Embodiment 2

[0040] A fast measurement method for the far-field pattern based on Fourier interpolation is the same as that in Embodiment 1, and the measurement interval criterion described in step 2 is on the order of the half-power beamwidth of the antenna to be measured. The calculation formula for the far-field measurement interval criterion of the antenna under test is:

[0041]

[0042] In the formula, is the test interval of the antenna under test, and HPBW represents the half-power beamwidth of the antenna under test. The sampling interval criterion proposed by the present invention is the half-power beamwidth order of the antenna to be tested. This sampling criterion is obtained through multiple experimental verifications and continuous optimization. Experimental results show that increasing the sampling interval of the antenna to be tested can reduce the The number of sampling points of the antenna to be tested does not affect the accuracy of the far-field pattern. Compared w...

Embodiment 3

[0044] A fast measurement method for far-field pattern based on Fourier interpolation is the same as embodiment 1-2, and the Fourier expansion coefficient formula described in step 4 of the present invention is:

[0045]

[0046] C in the formula n Represents the Fourier expansion coefficient under all discrete values, J represents the number of points of the function value in a period, n represents the value of the discrete point after the function is discretized, Represents the Fourier expansion coefficient within a period range, calculated by the following formula:

[0047]

[0048] N in the formula is determined by the size of the antenna and the position of the origin of the coordinates, T is the cycle of the function f(t), T / J represents the interval within a cycle, m is the discrete point of the value, and its value range is m= 0,...,J-1; the condition for the establishment of the above formula is that J≥2N+1, and N can be obtained by the following formula:

[...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a far-field pattern rapid measurement method based on Fourier interpolation, and solves the problem that the far-field measurement requires a small sampling interval to accurately reconstruct an antenna far-field pattern. The method comprises steps of determining the far-field distance of an antenna to be measured according to the far-field measurement condition of an antenna; determining a sampling interval by using a far-field measurement interval criterion of the antenna to be measured; sampling and measuring the amplitude and the phase of a radiation far field on a certain surface of the antenna, and calculating and obtaining the Fourier expansion coefficient and the far field pattern function of the far field of the antenna to be measured and the amplitude pattern and the phase pattern of the antenna to be measured in sequence, so that the rapid measurement of the far field pattern is realized. According to the method, the directional diagram with any small angle interval is quickly and accurately reconstructed based on the Fourier interpolation method of the band-limited periodic function, and the test efficiency is improved.he method comprises steps of The method is suitable for multi-channel, multi-beam and frequency sweeping tests, the number of sampling points can be greatly reduced, and the test efficiency is remarkably improved.

Description

technical field [0001] The invention belongs to the technical field of antennas, and mainly relates to antenna far-field measurement, in particular to a fast measurement method for far-field pattern based on Fourier interpolation, which is used for far-field measurement and can significantly improve test efficiency. Background technique [0002] Existing antenna measurement methods can generally be divided into far-field measurement and near-field measurement. The near-field measurement is in a microwave anechoic chamber, using a computer to control a test probe with known characteristics, and measure the amplitude and phase distribution of a certain surface field at a distance of 3 to 5 wavelengths from the antenna surface, and then use the near-field measurement data, test probe The characteristics and the shape of the scanning surface, and the far-field characteristics of the antenna are calculated by the near-far field transformation algorithm. According to the shape of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R29/10
CPCG01R29/10
Inventor 栗曦王可阳杨林郜静逸杨钰
Owner XIDIAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com