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High-precision horizontal measurement supporting device

A level measurement and support device technology, which is applied in the direction of measuring devices, supporting machines, machine tables/supports, etc., can solve the problems that the panel cannot be processed and inspected, and the panel processing accuracy requirements increase, so as to achieve compact structure, reduced self-weight deformation, The effect of high reliability

Pending Publication Date: 2021-10-29
NO 54 INST OF CHINA ELECTRONICS SCI & TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If effective measures are not taken to control this measurement deformation, the processing accuracy requirements of the panel will rise sharply, and even the panel will not be able to complete the processing and testing process.

Method used

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  • High-precision horizontal measurement supporting device
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  • High-precision horizontal measurement supporting device

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Embodiment Construction

[0023] Below, the present invention will be further described in conjunction with the accompanying drawings and specific embodiments.

[0024] A high-precision horizontal measurement support device includes a measurement platform, a top support structure, a balance support structure and the like.

[0025] The top supporting structure includes two groups, which are placed on the measuring workbench and mainly include a top support seat, a top support and a handle. The top support is composed of a top ball and a support rod, and is connected to the top support seat by the thread of the support rod. The top ball is placed on the top of the support rod and directly contacts the workpiece to provide point contact support for the workpiece. The handle is connected with the top support seat through threads.

[0026] The balance-type supporting structure is also placed on the measuring workbench, and is composed of a weighing base, a weighing rod, a connecting shaft, a handle and tw...

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Abstract

The invention discloses a high-precision horizontal measurement supporting device, and belongs to the technical field of high-precision horizontal detection. The device comprises a measurement platform, wherein a tip supporting structure and a balance type supporting structure are arranged on the measurement platform; the tip supporting structure comprises a supporting seat and a first top support; the balance type supporting structure comprises a balance seat, a supporting column, a connecting shaft, a balance rod and a plurality of second top supports; the supporting column is arranged in the balance seat; the balance rod is arranged on the supporting column through the connecting shaft; the plurality of second top supports are arranged on the balance rod and keep the balance of the balance rod; and each of the first top support and the second top supports comprises a supporting rod and a tip ball arranged at the top end of the supporting rod. According to the device, one reference positioning point is expanded into a plurality of supporting positioning points through a balance type self-balancing structure on the premise of not violating a three-point positioning theory, so that the passive precision of a workpiece on the horizontal measurement platform is improved, and the self-weight deformation of the workpiece to be measured is reduced.

Description

technical field [0001] The invention relates to the technical field of high-precision level detection and high-end precision manufacturing, in particular to a high-precision level measurement support device, which can be used for the detection of plane or curved surface structures with micron-level deformation precision. Background technique [0002] At present, structures that achieve micron-level deformation accuracy are widely used in aerospace, shipbuilding, automobiles, electronic communications, optics and other fields, which in turn increases the detection requirements for high-precision structures. Under normal circumstances, enterprises choose to use three-coordinate detectors to detect micron-level structural accuracy. The three-coordinate detector consists of testing equipment and a testing platform. [0003] In the process of traditional high-precision workpiece accuracy measurement, auxiliary parts such as pressure plates, bolts, gaskets and brackets are used t...

Claims

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Application Information

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IPC IPC(8): F16M11/04G01B21/00
CPCF16M11/04G01B21/00
Inventor 尹可鑫张伟明曹江涛张灵军张辉任兵锐
Owner NO 54 INST OF CHINA ELECTRONICS SCI & TECH GRP
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