Device for recording off-axis X-ray hologram

A technology of X-ray and hologram, which is applied in the direction of material analysis using radiation, processing by application of diffraction/refraction/reflection, instruments, etc., can solve interference, cannot refract or reflect X-rays, and limit the development of off-axis X-ray holography technology and other issues to achieve the effect of convenient handling

Inactive Publication Date: 2004-01-28
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
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Problems solved by technology

The biggest shortcoming of the former is that the reproduced image is interfered by the twin image (see prior art: Chen Jianwen, Xu Zhizhan, Zhu Peiping, Wang Zhijiang, "X-ray holography", Progress in Physics, 1995, Vol.15, No.2, 125- 146); while the latter requires a high-resolution zone plate
The main reason for limiting the development of these technologies is that under normal conditions, the refractive index of X-rays is less than 1, and general optical elements cannot refract or reflect X-rays, thus limiting the development of off-axis X-ray holography.

Method used

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  • Device for recording off-axis X-ray hologram
  • Device for recording off-axis X-ray hologram
  • Device for recording off-axis X-ray hologram

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Embodiment Construction

[0023] The device used in this example is image 3 shown. In order to obtain X-rays with good monochromaticity, the X-ray source 1 in this embodiment is composed of a synchrotron radiation source 101, a dispersive zone plate 102 and a pinhole diaphragm 103. The diameter of the dispersive zone plate 102 is 2.8 mm, and the maximum The width of the outer ring is 0.465 μm, the number of rings is N=1506, and the focal length of the first-order diffraction is 566 mm. The working wavelength of the dispersive zone plate 102 is in the range of 1.97nm-2.78nm. The distance between it and the pinhole diaphragm 103 is 490 mm to 710 mm, and the working wavelength can be selected by changing the distance from the dispersion zone plate to the pinhole diaphragm 103 . The pinhole diameters are 8, 30, and 200 microns, respectively, and the spatial coherence of the beam is determined by the selection of the pinhole diameter. The distance from the synchrotron radiation source 101 to the dispers...

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Abstract

A device for recording off-axis X-ray hologram has an X-ray source in the vacuum cavity in casing. The X-ray emitted from it is splitted into reference beam and object beam by a dual-waveband unit. The specimen to be tested it put before or behind the focus of object beam. The reference beam and object beam are crossed to form an interference field. A receiver in the interference field sends the received interference signal to computer, where a 3D hologram is reconstructed without twin images.

Description

technical field [0001] The invention relates to a device for recording off-axis X-ray holograms. Background technique [0002] Holography is a two-beam interference process, which records the specific wavefront of an object in the form of interference fringes, and then uses the principle of light diffraction to reproduce the recorded wavefront. [0003] Since the wavelength of X-rays is much smaller than that of visible light, a much higher resolution can be obtained than that of visible light; and because of the strong penetrability of X-rays, many objects that are "opaque" to visible light become "transparent" to X-rays. Therefore, X-ray holography has incomparable advantages to other imaging methods in the fields of natural science and life science: [0004] 1. High-resolution three-dimensional information of biological samples can be obtained. For X-ray holograms, it not only records the surface information of the sample, but also records the deep information of the sam...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04G02B5/00G03H1/04G21G1/12G21K1/06
Inventor 高鸿奕陈建文谢红兰徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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