Device for recording off-axis X-ray hologram
A technology of X-ray and hologram, which is applied in the direction of material analysis using radiation, processing by application of diffraction/refraction/reflection, instruments, etc., can solve interference, cannot refract or reflect X-rays, and limit the development of off-axis X-ray holography technology and other issues to achieve the effect of convenient handling
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[0023] The device used in this example is image 3 shown. In order to obtain X-rays with good monochromaticity, the X-ray source 1 in this embodiment is composed of a synchrotron radiation source 101, a dispersive zone plate 102 and a pinhole diaphragm 103. The diameter of the dispersive zone plate 102 is 2.8 mm, and the maximum The width of the outer ring is 0.465 μm, the number of rings is N=1506, and the focal length of the first-order diffraction is 566 mm. The working wavelength of the dispersive zone plate 102 is in the range of 1.97nm-2.78nm. The distance between it and the pinhole diaphragm 103 is 490 mm to 710 mm, and the working wavelength can be selected by changing the distance from the dispersion zone plate to the pinhole diaphragm 103 . The pinhole diameters are 8, 30, and 200 microns, respectively, and the spatial coherence of the beam is determined by the selection of the pinhole diameter. The distance from the synchrotron radiation source 101 to the dispers...
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