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Capacitor capacitance value measurement method in high-voltage environment

A high-voltage environment, capacitance capacitance technology, applied in the direction of capacitance measurement, measurement device, measurement of electrical variables, etc., can solve the problems of complex operation, unable to meet the test requirements of thousands of volts, and large equipment volume

Active Publication Date: 2021-11-19
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the LCR tester can guarantee high measurement accuracy, the equipment is bulky and the operation is complicated. The maximum voltage that can be measured is 2 V, which cannot meet the test requirements of thousands of volts in a high-voltage environment.
Capacitance bridge tester is quick and easy to use, stable in performance and high in measurement accuracy, but the maximum voltage it can provide for measurement is 26 V, which also cannot meet the actual test requirements

Method used

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  • Capacitor capacitance value measurement method in high-voltage environment
  • Capacitor capacitance value measurement method in high-voltage environment
  • Capacitor capacitance value measurement method in high-voltage environment

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Embodiment 1

[0039] This embodiment proposes a capacitance measurement method in a high-voltage environment, the process is as follows figure 1 shown, including the following steps:

[0040] S1: Use a voltmeter and an oscilloscope to obtain the capacitance C to be measured X The parameters of the high-voltage environment, including DC bias voltage, voltage amplitude and voltage frequency;

[0041] S2: build as figure 2 The shown voltage and current measurement circuit consists of a high-voltage DC bias unit, a high-frequency transformer unit and a discharge unit connected in series, and the measured capacitance C X Connect in parallel with the discharge unit to measure the capacitance C X The voltage and current of the corresponding primary side of the high-frequency transformer unit; where, such as image 3 as shown,

[0042] The high-voltage DC bias unit includes a high-voltage DC stabilized power supply, a resistor R, and a capacitor C connected in series, and the two ends of the ...

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Abstract

The invention provides a capacitor capacitance value measurement method in a high-voltage environment, and belongs to the technical field of capacitance measurement, the method comprises the following steps: firstly obtaining parameters of the high-voltage environment where a capacitor to be measured is located, and constructing a voltage and current measurement circuit of a loop formed by connecting a high-voltage direct current bias unit, a high-frequency transformation unit and a discharge unit connected with the capacitor to be measured in parallel in series; taking the adjustable capacitor as a to-be-measured capacitor to access a voltage and current measuring circuit to obtain a reference working curve; after a to-be-measured capacitor is connected, disconnecting the discharging unit, starting the high-voltage direct-current stabilized power supply to output high voltage, starting the high-frequency voltage transformation unit to measure the voltage and current of a primary side, closing the high-voltage direct-current stabilized power supply and the high-frequency voltage transformation unit, and connecting the discharging unit; and according to the voltage and the current corresponding to the to-be-measured capacitor, searching an optional capacitance value in the reference working curve which is used as the capacitance value of the to-be-measured capacitor in the high-voltage environment. According to the invention, the working state of the circuit is ensured to be consistent when the reference working curve is obtained and the to-be-measured capacitor is measured, and high-precision capacitor capacitance measurement in a high-voltage environment is realized.

Description

technical field [0001] The invention belongs to the technical field of capacitance measurement, and in particular relates to a method for measuring capacitance value in a high-voltage environment. Background technique [0002] High-voltage capacitors are widely used in ignition, X-ray, large substation and other equipment. In a high-voltage environment of 1.5~20 kV, the capacitance of the capacitor will change. Due to the lack of an effective capacitance measurement method in a high-voltage environment, the current circuit design often regards the capacitance value as a constant, resulting in large deviations in circuit parameters and difficult calibration. Traditional capacitance measurement instruments are mainly used for measurement in low-voltage environments, such as LCR testers, capacitance bridge testers, etc. Although the LCR tester can guarantee high measurement accuracy, the equipment is large in size and complicated to operate. The maximum voltage that can be pr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26
CPCG01R27/2605
Inventor 何鹏白利兵周权张旭张杰程玉华
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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