A process parameter estimation method, device, electronic equipment and storage medium

Abstract

Embodiments of the present application provide a process parameter estimation method, device, electronic equipment, and storage medium. The method includes collecting the measured value of the first variable according to the preset sampling interval time; according to the measured value, obtaining the first parameter and the second parameter of the first variable, wherein the first parameter is used to represent the impact of the noise signal on the first variable in The degree of influence of the increment within the preset sampling interval, the second parameter is used to indicate the degree of change of the measured value with time; according to the first parameter and the second parameter, the magnitude of the noise signal is determined; based on the magnitude of the noise signal, An a posteriori estimate of the second variable is determined; wherein the first variable is functionally related to the second variable. Therefore, the solution of the present application can improve the estimation accuracy of process parameters, thereby shortening the response time to achieve the same accuracy.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to a process parameter estimation method, device, electronic equipment and storage medium. Background technique [0002] In the condition monitoring system, the process parameters reflect the working state of the whole system, which is the basis and key to the normal operation of the system. Therefore, fast and accurate state monitoring process parameter estimation is of great significance for safe production. [0003] In the existing condition monitoring process parameter estimation technology, the estimation accuracy and response time have high requirements for the accurate measurement of the initial stage signal. However, in some condition monitoring systems, the signal amplitude in the initial stage is small and is greatly affected by noise, so that the estimation of process parameters is greatly disturbed. That is to say, if the calculation method relying on the signa...

AI Technical Summary

Problems solved by technology

However, in some condition monitoring systems, the signal amplitude in the initial stage is small and is greatly affected by noise, so that the estimation of process parameters is greatly disturbed

That is, the estimation of process parameters by the calculation method relying on the signal in the initial stage will cause the problem of poor stability of the calculation results when the signal amplitude in the initial stage is small, and the problem of long measurement response time and poor real-time performance when the signal amplitude in the initial stage is large

[0004] It can be seen from the above that the process parameter estimation method in the prior art is greatly affected by system noise interference, which makes the estimation result less accurate, and the response time required to achieve higher accuracy is longer

Images