Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Small sample remote sensing image scene classification method based on iterative feature distribution learning

A feature distribution and remote sensing image technology, applied in the field of image processing, can solve the problems of deep network model overfitting and poor classification performance, and achieve the effect of improving convergence speed, improving accuracy and simple structure

Pending Publication Date: 2021-12-24
NORTHWESTERN POLYTECHNICAL UNIV
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a small sample remote sensing image scene classification method based on iterative feature distribution learning for the problem that the deep network model is easy to overfit and the classification performance is poor when the number of samples is insufficient, and its structure is simple , reasonable design

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Small sample remote sensing image scene classification method based on iterative feature distribution learning
  • Small sample remote sensing image scene classification method based on iterative feature distribution learning
  • Small sample remote sensing image scene classification method based on iterative feature distribution learning

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The method of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments of the present invention.

[0036] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0037] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof....

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a small sample remote sensing image scene classification method based on iterative feature distribution learning. The method comprises the following steps: step 1, setting an iterative feature distribution learning network framework; step 2, generating a similarity matrix between the image samples; step 3, training a small sample classifier by utilizing guide knowledge based on classification prediction probability and a similarity matrix; and step 4, correcting the feature distribution by using the prediction probability distribution matrix and the attention weight, and then iteratively updating the whole network. The method is simple in structure and reasonable in design, firstly, the similarity matrix is generated to obtain feature association between samples, secondly, the classifier can be trained under the guidance of historical classification prediction, finally, the attention mechanism is adopted to correct the features, and the corrected features are input into the network again to realize iterative updating of the whole network. According to the method, through iterative feature distribution learning, the characterization capability of the category can be further improved, so that the small sample classification accuracy is improved.

Description

technical field [0001] The invention belongs to the technical field of image processing, and in particular relates to a small sample remote sensing image scene classification method based on iterative feature distribution learning. Background technique [0002] With the development of artificial intelligence technology, deep learning can achieve satisfactory results in some scenarios by virtue of deep and complex network models, huge training data support and powerful hardware support in computer vision tasks. However, for a small number of (single) sample learning tasks, deep learning cannot improve the learning ability from complex network models and large amounts of training data. Therefore, the few-shot learning technique that learns data patterns from a few (single) samples has become a hot research direction in the current deep learning field. [0003] Small sample learning aims to achieve the ability to identify unknown categories through a small number of training s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/00G06K9/46G06K9/62G06N3/04G06N3/08
CPCG06N3/08G06N3/045G06F18/22G06F18/2415
Inventor 耿杰曾庆捷蒋雯邓鑫洋
Owner NORTHWESTERN POLYTECHNICAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products