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Frequency characteristic testing method based on electric field force excitation and optical tweezers system

A frequency characteristic test, electric field force technology, applied in the direction of testing optical performance, frequency measurement devices, etc., can solve problems such as complex calculation process

Pending Publication Date: 2021-12-28
ZHEJIANG UNIV +1
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

The first two methods need to know the differential equation and transfer function of the optical tweezers system, and the calculation process is more complicated

Method used

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  • Frequency characteristic testing method based on electric field force excitation and optical tweezers system
  • Frequency characteristic testing method based on electric field force excitation and optical tweezers system
  • Frequency characteristic testing method based on electric field force excitation and optical tweezers system

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Experimental program
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Embodiment

[0049] Such as image 3 and Figure 4 , select 30 frequency points at uniform intervals within the test frequency range of 0-200Hz, and apply a pressure of 2.5*10 -4 For the electric field of mBar, the radius of the micro-nano particle 4 is 80nm, the applied voltage is 10V, and the electric field force on the particle is about 3*10 -14 N, the signal-to-noise ratio is 20dB, and the amplitude-frequency response characteristics and phase-frequency response characteristics of the optical tweezers system can be clearly observed, so as to obtain the frequency characteristics of the optical tweezers system. This method can test different frequency characteristics of the optical tweezers system under different pressure conditions.

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Abstract

The invention discloses a frequency characteristic testing method based on electric field force excitation and an optical tweezers system. The method comprises the steps that sinusoidal voltage is applied to the optical tweezers system, and if micro-nano particles move, the micro-nano particles are electrified; if the micro-nano particles do not move, the micro-nano particles are electrified through an air ionization method, the electrified micro-nano particles generate displacement, and the input amplitude and the input phase are obtained; sinusoidal electric fields with different frequencies are applied to the charged micro-nano particles, a plurality of output amplitudes and output phases are obtained, a plurality of normalized amplitude-frequency response values and phase-frequency response values are calculated, a curve is drawn, amplitude-frequency response characteristics and phase-frequency response characteristics are obtained, and then the frequency characteristics of the optical tweezers system are tested. Correlation double beams in the optical tweezers system are converged through two focusing lenses to form an optical trap, and a micro-nano particle is stably captured at the center of the optical trap. The frequency spectrum of the optical tweezers system is generated by particle movement, and the method is used for precisely measuring the frequency characteristic of the optical tweezers system in the whole working frequency range.

Description

technical field [0001] The invention relates to an optical tweezers system testing method, in particular to a frequency characteristic testing method based on electric field force excitation and an optical tweezers system. Background technique [0002] Light has energy and momentum. When light interacts with particles, the momentum of light will change. According to the law of conservation of momentum, particles will gain a certain amount of momentum, resulting in motion phenomena. The optical tweezers system uses the optical trap force to capture, manipulate and cool particles. The optical trap force is the resultant force of the gradient force and the scattering force. Going back to the center of the light trap, the movement process of particles in the light trap follows the Langevin equation. An optical tweezers system generally consists of a capture module, a cooling module, and a detection module. [0003] It has been about 30 years since the first single-beam optical...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/02G01M11/02
CPCG01R23/02G01M11/02
Inventor 陈杏藩王姣姣朱绍冲傅振海
Owner ZHEJIANG UNIV
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