Method for testing offset voltage of operational amplifier circuit
An operational amplifier and offset voltage technology, which is applied in the field of testing the offset voltage of the operational amplifier circuit, can solve problems such as poor stability of the operational amplifier loop, circuit misjudgment, and increased production costs, and achieve the effect of ensuring accuracy
Pending Publication Date: 2022-02-18
NO 47 INST OF CHINA ELECTRONICS TECH GRP
View PDF5 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] Existing Offset Voltage Debugging Methods image 3 As shown, the test of the offset voltage is carried out by using the closed loop of the tested op amp itself. The disadvantage of this test is that the stability of the op amp loop is poor.
The other is to measure directly at the output of the circuit under test. This method is simple and easy to understand, but the measured result is affected by the offset voltage of the circuit itself. This influence is very critical. If the offset voltage of the circuit is below the microvolt level Yes, the measurement equipment used at the output of the circuit under test must be more accurate than the offset voltage by an order of magnitude, otherwise the test results will be inaccurate
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0024] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0025] A method for testing the offset voltage of an operational amplifier circuit is suitable for an operational amplifier circuit with two input terminals, one output terminal, two power supply voltages and no GND.
[0026] This method is applicable to the input common-mode voltage provided in the operational amplifier circuit data is zero, or the input common-mode voltage is a certain voltage value, such as common OP37, OP27 is a single operational amplifier with dual power supply voltage, the input common-mode voltage is Zero, while the AD8628 is a single-supply single-op amp with an input common-mode voltage of 2.5V.
[0027] A method for testing the offset voltage of an operational amplifier circuit: comprising:
[0028] For the dual op amp, single op amp, and quad op amp circuits whose offset voltage test condition is zero common-mode ...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention relates to a method for testing offset voltage of an operational amplifier circuit. The operational amplifier circuit is provided with two input ends, two power supply ends and one output end, the overall level of a device can be increased or decreased by the same voltage at the same time as long as the conditions are met, and for the operational amplifier, the level does not change. The offset voltage test can be carried out on the operational amplifier under different common-mode voltage conditions and mutual conversion test conditions, or the accuracy of the test result of the offset voltage can be verified under different conditions. The test method is not only suitable for operational amplifiers, but also suitable for comparator circuits. According to the invention, an auxiliary operational amplifier ring is used for testing the offset voltage, the auxiliary operational amplifier is connected to the rear end of a tested circuit, and the test result of the tested circuit is amplified, so that the accuracy and reliability of the test result are ensured.
Description
technical field [0001] The invention belongs to the field of analog circuit testing in integrated circuit testing, in particular to a testing method for offset voltage of operational amplifier circuits. This method is suitable for operational amplifiers with dual power supply voltage and single power supply voltage, and is not limited by the test conditions of offset voltage. Background technique [0002] Operational amplifiers are widely used in our daily life, and offset voltage is one of the key indicators to measure the performance of operational amplifiers. Therefore, the size of the offset voltage determines the drift of the output voltage of the op amp during use, which affects the stability of the op amp during the entire use process. [0003] Existing Offset Voltage Debugging Methods image 3 As shown, the test of the offset voltage is carried out by using the closed loop of the tested op amp itself. The disadvantage of this test is that the stability of the op amp...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 康锡娥薛宏
Owner NO 47 INST OF CHINA ELECTRONICS TECH GRP