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Non-contact voltage measuring device based on multistage plate differential probe

A voltage measurement, non-contact technology, applied in the direction of measurement using digital measurement technology, can solve problems such as not meeting the test requirements, and achieve good practicability, portability, and small size

Active Publication Date: 2022-03-18
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at some measurement points with high precision requirements, the traditional non-contact voltage measurement device still cannot meet its test requirements

Method used

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  • Non-contact voltage measuring device based on multistage plate differential probe
  • Non-contact voltage measuring device based on multistage plate differential probe
  • Non-contact voltage measuring device based on multistage plate differential probe

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0038] figure 1 It is the principle diagram of the non-contact voltage measuring device based on the multi-level board differential probe of the present invention.

[0039] In this example, if figure 1 As shown, the present invention is a non-contact voltage measuring device based on a multi-level plate differential probe, including: a multi-plate differential probe, a signal processing module, an analog-to-digital conversion module and an MCU data processing module connected in series in sequence, and an independent external power module;

[0040] In this example, if figure 2 As shown, the multi-level plate differential probe includes: electrode plate 2, probe mounting cover 3, probe mounting shell 4, insulating elastic material 5 and constraining magnet 6; wherein, figure 2 1 in is the line to be tested;

[0041] The electrode plate 2 adopts a flexible PCB board, and its top layer is 2N electrode plates symmetrically distributed in an array. The plate and the ground l...

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PUM

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Abstract

The invention discloses a non-contact voltage measuring device based on a multi-stage plate differential probe, which comprises the multi-stage plate differential probe, a signal processing module, an analog-to-digital conversion module, an MCU data processing module and an independent power supply module, when non-contact voltage measurement is carried out, the probe is similar to a clamp, a wire to be measured is clamped in the center of an insulating elastic material, and the probe is buckled with a shell, so that the probe wraps the wire to be measured, and a plurality of input signals are obtained through parasitic capacitance formed by the probe and a circuit to be measured; an amplification and filtering unit in the signal processing module processes an input signal and generates an output signal, and the data processing module combines a transfer function and a relationship of the corresponding output signal to construct a relational expression of an input voltage signal and an output voltage signal and solves the relational expression, thereby obtaining a voltage value of a to-be-detected line.

Description

technical field [0001] The invention belongs to the technical field of voltage measurement, and more specifically relates to a non-contact voltage measurement device based on a multi-level board differential probe. Background technique [0002] The traditional contact meter first needs to destroy the insulation layer of the wire during installation, and at some measurement points where the insulation layer cannot be damaged, a non-contact voltage measuring device needs to be used to measure the voltage. [0003] The traditional non-contact voltage measurement device is based on a differential sensor probe for voltage measurement, which is composed of two plates, and only one induced voltage can be obtained when sensing the electric field generated by the line to be tested. In addition, because its shape is not fixed , the test data obtained when the same line is measured many times before and after will change, so only an estimated value with a large error can be provided, a...

Claims

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Application Information

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IPC IPC(8): G01R19/25
CPCG01R19/25
Inventor 李坚黄琦刘金璞贾奥孙敏蔡东升胡维昊张真源易建波井实
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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