Data processing method of electronic test system and FPGA (Field Programmable Gate Array) data processing module

Abstract

The invention discloses a data processing method of an electronic test system and an FPGA data processing module, the FPGA data processing module comprises a test data device, a USB input interface, an FIFO read-in module, an algorithm module, an FIFO output module, a USB output interface, a PC and an integrated circuit, and the test data device is connected with the USB input interface of the integrated circuit through a data line. According to the data processing method and the FPGA data processing module of the electronic test system, test data equipment is adopted to provide test data for the data processing module, the test data are accessed to the FPGA data processing module of an algorithm module through a USB line, and FIFO in the FPGA data processing module reads the test data in sequence. According to the method and the device, the data in the FIFO is processed by using the untrusted data rejection algorithm based on the unascertained rational number, the processed data is stored in the FIFO, the result data is output to the PC through the USB interface, and the untrusted unknown data is provided in the output data, so that the test accuracy of the test data equipment is greatly improved.

Description

technical field [0001] The invention relates to the technical field of electronic test equipment, in particular to a data processing method and an FPGA data processing module of an electronic test system. Background technique [0002] At present, electronic test equipment generally does not have the ability to process the measured data, so that the test data will contain more systematic error data, reduce the credibility of the test data, increase the difficulty of user data processing, and directly affect the accuracy and accuracy of the final conclusion. reliability. [0003] In addition, the error monitoring of the measured data by the electronic test equipment is currently carried out by monitoring the temperature, vibration and other state parameters of the equipment. However, in many cases, when the working state of the electronic test equipment changes slightly, this change will cause the test data to contain certain systematic errors, but will not cause changes in t...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a data processing method and FPGA data processing module of an electronic test system, to solve the problem that when the working state of the electronic test equipment proposed in the above-mentioned background technology changes slightly, this change will make the test data contain certain The problem of systematic error

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