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A temperature and salt depth measuring instrument testing and screening device

A technology for screening devices and measuring instruments, which is applied in the field of testing and screening devices for temperature, salt and depth measuring instruments, can solve problems such as cost increase, time-consuming one to two days, and production capacity reduction, so as to reduce trial and error costs, shorten test cycles, and improve production efficiency effect

Active Publication Date: 2022-05-24
STATE OCEAN TECH CENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The temperature, conductivity and pressure technical indicators of CTD need to reach the accuracy of 0.002℃, 0.003mS / cm and 0.05%F.S. respectively. At present, the evaluation of this indicator can only be carried out by the experiment of CTD whole machine. The whole machine of CTD includes the measurement circuit and For sensors connected to the measurement circuit, an experiment takes one to two days, and the entire experiment cycle lasts for several weeks or months, which is time-consuming, laborious and increases production costs
Especially when the temperature, conductivity and pressure measurement performance of the CTD machine exceeds the technical indicators, it is often difficult to confirm whether there is a problem with the measurement circuit or the sensor, and it is impossible to rule out whether it is the result of the joint action of the two. Production experimenters tentatively replaced and checked based on experience, and then re-tested the whole machine, resulting in too long CTD factory test cycle, increased cost, and reduced production capacity.

Method used

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  • A temperature and salt depth measuring instrument testing and screening device
  • A temperature and salt depth measuring instrument testing and screening device

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] From the measurement principle, the temperature and salinity measuring instrument obtains seawater temperature information by measuring the resistance value of the temperature sensor (such as thermistor), obtains seawater conductivity information by measuring the resistance value of seawater in the conductivity sensor, and measures the resistance value of the pressure sensor. Get seawater pressure information. The measurement accuracy of the temperature and salinity measuring instrument depends on two factors: the measuring circuit and the sensor. The test and screening device for the temperature and salinity measuring instrument proposed in this embodiment can respectively realize the testing and screening of the measuring circuit and the sensor in the temperature and salinity measuring instrument, so that Starting from both the measurement circuit and the sensor, test and confirm the accuracy and stability of the measurement circuit and sensor before the temperature an...

specific Embodiment approach

[0069] Wherein, any measured sensor can be a temperature sensor, a conductivity sensor or a pressure sensor. figure 2 The temperature and salinity measuring instrument test screening device shown can simultaneously test 8 temperature sensors or 8 conductivity sensors in one temperature and salinity experiment, or test 4 pressure sensors simultaneously in one pressure experiment, and evaluate the temperature and salinity measuring instruments in batches Measurement accuracy and stability of medium temperature sensors, conductivity sensors and pressure sensors. The specific implementation is as follows:

[0070] When the temperature sensor in the temperature and salt depth measuring instrument needs to be tested, the third terminal C and the fifth terminal E are short-circuited, and the fourth terminal D and the sixth terminal F are short-circuited. Short-circuit, the temperature measurement circuit in the standard measurement circuit is connected to the third terminal C and t...

Embodiment 2

[0088] The invention also provides a testing and screening device for a temperature and salt depth measuring instrument, comprising: a host computer and a testing and screening device for a measuring circuit.

[0089] The host computer is respectively connected with the control terminal of the measurement circuit test screening device and the output terminal of the measured circuit; the output terminal of the measurement circuit test screening device is connected with the input terminal of the measured measurement circuit; the The upper computer is used to control the measurement circuit test screening device to output the standard resistance value, obtain the measurement value output by the measured measurement circuit, and compare the measurement value with the standard resistance value to obtain the test of the measured measurement circuit. result.

[0090] For the same parts as in Embodiment 1, refer to Embodiment 1, and details are not repeated here. In this embodiment, ...

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Abstract

The invention discloses a testing and screening device for a temperature, salt, and depth measuring instrument, which relates to the technical field of instrument testing. The testing and screening device for a temperature, salt, and depth measuring instrument includes: a host computer, a measuring circuit testing and screening device, and a sensor testing and screening device. When the measuring circuit in the temperature, salt and depth measuring instrument is tested, the upper computer is respectively connected with the measuring circuit testing and screening device and the measured measuring circuit, and the measuring circuit testing and screening device is connected with the measured measuring circuit. When the sensor is tested, the upper computer is respectively connected with the sensor test screening device and the standard measurement circuit in the temperature, salt and depth measuring instrument, the measurement circuit test screening device is connected with at least one sensor under test, and the output terminal of the measurement circuit test screening device is connected to the standard measurement circuit. Measuring circuit connections. The invention can independently test and screen the measuring circuit and the sensor in the temperature, salt and depth measuring instrument, thereby shortening the test period, reducing trial and error costs and improving production efficiency.

Description

technical field [0001] The invention relates to the technical field of instrument testing, in particular to a testing and screening device for a temperature and salt depth measuring instrument. Background technique [0002] The Conductivity Temperature Depth profiler (CTD) is used to measure the temperature, conductivity and pressure of seawater, and then obtain the information of seawater temperature and salinity at different depths. Important factors affecting the distribution and evolution of elements such as hydrology, meteorology, chemistry and biology, as the most basic instrument for oceanographic surveys, the measurement accuracy of CTD is very important. [0003] The technical indicators of temperature, conductivity and pressure of CTD need to reach the accuracy of 0.002°C, 0.003mS / cm and 0.05%F.S. respectively. At present, the evaluation of this indicator can only be carried out by relying on the test of the CTD machine. The CTD machine includes the measurement cir...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B07C5/34B07C5/344B07C5/02
CPCB07C5/34B07C5/344B07C5/02
Inventor 田雨张挺车亚辰
Owner STATE OCEAN TECH CENT