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Method and device for improving solid state disk function test efficiency, equipment and medium

A solid-state hard drive and functional testing technology, which is applied in the direction of faulty hardware testing methods, static memory, error detection/correction, etc., can solve the problems of long test time and low test efficiency, and achieve the effect of reducing time and improving test efficiency

Pending Publication Date: 2022-03-29
SHENZHEN YILIAN INFORMATION SYST CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] In the SSD (solid state drive) testing process, the method of testing one by one is generally used to confirm the functions of SOC (controller), DDR (memory particles), and NAND Flash (flash memory particles). The test time of granules) is getting longer and longer. Generally, it takes about 2 minutes to complete a full-address Pattern test (test of different data models) for 512M DDR (memory granules). If the waiting time is 30 minutes to test the data retention capacity of DDR, execute 10 The Retention test of a Pattern takes more than 6 hours, the test time is long, and the test efficiency is low

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  • Method and device for improving solid state disk function test efficiency, equipment and medium
  • Method and device for improving solid state disk function test efficiency, equipment and medium
  • Method and device for improving solid state disk function test efficiency, equipment and medium

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Embodiment Construction

[0045] In order to fully understand the technical content of the present invention, the technical solutions of the present invention will be further introduced and illustrated below in conjunction with specific examples, but not limited thereto.

[0046] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0047] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "comprises" indicate the presence of described features, integers, steps, operations...

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Abstract

The embodiment of the invention discloses a method and device for improving solid state disk function test efficiency, equipment and a medium. The method comprises the steps that a hold test of a data model of memory particles is executed; executing a data erasing, reading and writing test of the flash memory particles in the process of executing the holding test of the data model; after the execution of the data erasing, reading and writing test of the currently executed flash memory particles is completed, directly entering the next round of data erasing, reading and writing test of the flash memory particles, and judging whether the retention test of the data model of the currently executed memory particles is completed or not; and if the hold test of the data model of the memory particle which is being executed is completed, entering a next round of hold test of the data model of the memory particle. According to the invention, the test efficiency is improved, and the time required by the whole test is reduced.

Description

technical field [0001] The present invention relates to a solid state hard disk, more specifically to a method, device, equipment and medium for improving the efficiency of solid state hard disk function testing. Background technique [0002] In the SSD (solid state drive) testing process, the method of testing one by one is generally used to confirm the functions of SOC (controller), DDR (memory particles), and NAND Flash (flash memory particles). The test time of granules) is getting longer and longer. Generally, it takes about 2 minutes to complete a full-address Pattern test (test of different data models) for 512M DDR (memory granules). If the waiting time is 30 minutes to test the data retention capacity of DDR, execute 10 The Retention test of a Pattern takes more than 6 hours, the test time is long, and the test efficiency is low. Contents of the invention [0003] The purpose of the present invention is to overcome the deficiencies of the prior art, and provide a...

Claims

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Application Information

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IPC IPC(8): G06F11/22G11C29/08G11C29/56
CPCG06F11/2273G06F11/2205G11C29/56G11C29/08
Inventor 陈道华赵军委王伟良
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD