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Method for correcting and aligning fluxgate magnetometer array

A magnetometer and fluxgate technology, used in instruments, measuring devices, measuring electrical variables, etc., can solve problems such as the deviation of the fluxgate magnetometer, and achieve the effect of simplifying the parameter solution process.

Pending Publication Date: 2022-04-05
NANJING UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In summary, the calibration alignment method of fluxgate magnetometer array based on ellipsoid fitting is practical, but it requires a three-axis non-magnetic turntable and accurate measurement of the rotation angle
In addition, since the orthogonal coordinate system of the reference platform frame may have non-orthogonal angles, the fluxgate magnetometer after its final alignment still has deviations

Method used

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  • Method for correcting and aligning fluxgate magnetometer array
  • Method for correcting and aligning fluxgate magnetometer array
  • Method for correcting and aligning fluxgate magnetometer array

Examples

Experimental program
Comparison scheme
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Embodiment

[0066] Select a space area to measure the magnetic field intensity in the center of the space area with an optical pump magnetometer, requiring the gradient to be less than 1nT / m, and the fluctuation of the measured value of the magnetic field intensity to be less than 1nT. Record the average of the measurements as G m . Assume its vector value S 0 , S 0 =[S x S y S z ] T .

[0067] The fluxgate magnetometer array rotates around the center of the array in the selected area. And the rotation angle is not less than 360°, so that the rotation track can form a spherical surface.

[0068] The measurements of the fluxgate magnetometer array during rotation are recorded as B jix , B jiy , B jiz , j represents the jth fluxgate magnetometer, j=0, 1, 2, 3...P-1. i represents the i-th data point collected, i=1, 2, 3...N.

[0069] According to the ellipsoid fitting algorithm, the model parameter k is obtained j 、h j , the genetic algorithm with the root mean square error ...

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Abstract

The invention discloses a correction alignment method for a fluxgate magnetometer array, and the method comprises the steps: carrying out the alignment of a plurality of fluxgate magnetometers through employing a genetic algorithm with a measurement coordinate system of one fluxgate magnetometer as a reference, and defining an average differential modulus as a fitness function of the genetic algorithm in an alignment process, the correction and alignment method does not need to measure the rotation angle and does not require the positive angle of the mechanical coordinate system of the platform. According to the method, the problem that a three-axis rotation non-magnetic turntable is needed for auxiliary measurement in the conventional method is effectively solved, the parameter solving process of fluxgate magnetometer array correction alignment is simplified, and the method has practical significance.

Description

technical field [0001] The invention belongs to the technical field of magnetic measurement and the calibration field of fluxgate magnetometers, and in particular relates to a method for correcting and aligning a fluxgate magnetometer array. Background technique [0002] The output error of a single fluxgate magnetometer in the magnetic gradient tensor measurement system and the installation error between fluxgate magnetometers will seriously affect the measurement of the magnetic gradient tensor. The errors of a single fluxgate magnetometer include the calibration factors of the three axes, non-orthogonal errors, and hard magnetic interference. When multiple fluxgate magnetometers are assembled into a magnetometer array, there will be misalignment errors between each magnetometer. Typically, each magnetometer needs to be calibrated individually, followed by an alignment of the different magnetometers throughout the system. [0003] For the calibration of a single fluxgate...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
CPCY02A90/30
Inventor 王宏波董笙雅金煌煌庄志洪凌姐丫
Owner NANJING UNIV OF SCI & TECH