Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Synchronous discrimination method for interference of fast neutron and silicon reaction on 3He sandwich spectrometer

A technology of fast neutron and spectrometer, which is applied in the field of synchronous screening of fast neutron and silicon reaction to 3He sandwich spectrometer interference, which can solve the problems of poor screening effect, high measurement cost, and low measurement efficiency, so as to avoid waste, The process is simple and reliable, and the effect of avoiding operation waste

Pending Publication Date: 2022-04-22
NORTHWEST INST OF NUCLEAR TECH
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The invention provides a fast neutron and silicon reaction pair 3 A simultaneous screening method for He sandwich spectrometer interference. This method mainly solves the problems of low measurement efficiency, high measurement cost, and poor screening effect that existing screening methods need to carry out two experiments.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Synchronous discrimination method for interference of fast neutron and silicon reaction on 3He sandwich spectrometer
  • Synchronous discrimination method for interference of fast neutron and silicon reaction on 3He sandwich spectrometer
  • Synchronous discrimination method for interference of fast neutron and silicon reaction on 3He sandwich spectrometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036]The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention, and are not intended to limit the protection scope of the present invention.

[0037] The reaction between neutrons and silicon really fits the background analysis;

[0038] Silicon has three natural isotopes 28 Si, 29 Si, 30 Si, which can react with fast neutrons and cause effective coincidence counts mainly has 28 Si(n,α) 25 Mg, 28 Si(n,p) 28 Al, 29 Si(n,α) 26 Mg, 29 Si(n,p) 29 Four reactions of Al, as shown in formula (2), the reaction cross-section curve is as follows image 3 As shown, other reactions may not be considered due to low cross section or high threshold energy.

[0039]

[0040] Depend on image 3 It can be seen that when the neutron energy is greater than 5 MeV, the cross ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a synchronous discrimination method for interference of reaction of fast neutrons and silicon on a 3He sandwich spectrometer. The method mainly solves the problems of low measurement efficiency, high measurement cost and poor discrimination effect due to the fact that two tests need to be carried out in an existing discrimination method. The method comprises the following steps: 1, filling a 3He gas into a 3He fast neutron sandwich spectrometer detector, and measuring to obtain measured original spectrum data; step 2, calculating Si (n, alpha) Mg coincidence event count while measuring original spectrum data; 3, simulating and calculating a theoretical neutron spectrum; step 4, acquiring a ratio of Si (n, alpha) Mg coincidence event count to Si (n, p) Al coincidence event count in the theoretical neutron spectrum; 5, calculating to obtain Si (n, p) Al coincidence event count; and step 6, deducting Si (n, alpha) Mg coincidence event count and Si (n, p) Al coincidence event count from the measured original spectrum data obtained in the step 1 to obtain a neutron spectrum according with the background.

Description

technical field [0001] The invention belongs to the technical field of neutron energy spectrum measurement, in particular to a reaction pair of fast neutrons and silicon 3 Simultaneous discrimination method for He sandwich spectrometer interference. Background technique [0002] Such as figure 1 as shown, 3 The detector core of the He fast neutron sandwich spectrometer adopts a proportional detector and two opposite semiconductor detectors. 3 He gas, 3 He and neutrons occur 3 He(n,p) 3 H reaction formula (1), the protons and tritium produced by the reaction first deposit energy in the proportional detector, and finally enter the two semiconductor detectors respectively and are detected. [0003] 3 He+n→p+T+0.765MeV (1) [0004] Only when three detectors generate pulse output at the same time, it can be recorded as an effective coincidence event. At this time, the neutron energy is the coincidence energy measured by the three detectors minus the reaction energy of 0.7...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01T3/08
CPCG01T3/08
Inventor 张文首江新标邬泽鹏包利红杨宁
Owner NORTHWEST INST OF NUCLEAR TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products