Abnormity screening test device for automatically switching parallel capacitors based on Internet of Things
A technology for automatic switching and testing devices, applied in measuring devices, single semiconductor device testing, instruments, etc., can solve problems such as heavy workload, low testing efficiency, and potential safety hazards, reduce the number of people climbing and improve abnormal testing Efficiency, improve the effect of operating personal safety
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[0023] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0024] see Figure 1-2 , the present invention provides a technical solution:
[0025] An abnormal screening test device based on the Internet of Things for automatically switching parallel capacitors, including an industrial computer, a display, at least one local control capacitance measurement unit, at least one remote capacitance measurement unit, a capacitance acquisition unit, an execution unit, and an alarm unit;
[0026] Display: connected to the industria...
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