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Defect geometric feature extraction method for infrared nondestructive testing

A technology of infrared non-destructive testing and extraction method, which is applied in material defect testing, analysis of solids using sonic/ultrasonic/infrasonic waves, etc. It can solve the problems of misjudgment of segmentation, difficulty in optimizing thresholds, and cumbersome solution of thresholds. effect of use

Active Publication Date: 2022-05-13
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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Problems solved by technology

However, from the perspective of improving the single threshold to solve the problem of segmentation misjudgment caused by thermal diffusion, there are problems such as difficulty in optimizing the threshold and cumbersome calculation of the threshold.

Method used

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  • Defect geometric feature extraction method for infrared nondestructive testing
  • Defect geometric feature extraction method for infrared nondestructive testing
  • Defect geometric feature extraction method for infrared nondestructive testing

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Embodiment 1

[0098] Using the method of the present invention to image 3 and Figure 4 The infrared original images of the rectangular defect and the triangular defect are processed, and the double thresholds of the infrared image of the rectangular defect are 185 and 204, and the double thresholds of the infrared image of the triangular defect are 115 and 189; and then the morphological edge detection is performed by the step 2 The result is as Figure 6 , Figure 7 As shown, among them, picture (a) is the original detection picture, picture (b) is the result of the maximum entropy double threshold value segmentation based on genetic algorithm, picture (c) is the morphological edge detection based on picture (b) result.

[0099] In order to quantitatively analyze the accuracy of the detection results of the algorithm of the present invention, the geometric characteristics of the rectangular defect are quantitatively analyzed. The geometric size of the actually simulated rectangular de...

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Abstract

The invention aims to provide a defect geometric feature extraction method for infrared nondestructive testing, and belongs to the technical field of infrared nondestructive testing. According to the method, the influence of thermal diffusion on image segmentation is considered, a to-be-detected infrared image is segmented into black, gray and white conditions based on double thresholds, the black, gray and white conditions correspond to a defect-free part, a thermal diffusion influence part and a defect part respectively, and then defect geometric features are obtained through morphological edge detection. Accurate extraction of the defect geometric features under the consideration of the influence of thermal diffusion is realized, and the method has the advantage of high accuracy.

Description

technical field [0001] The invention belongs to the technical field of infrared nondestructive testing, and in particular relates to a defect geometric feature extraction method of infrared nondestructive testing. Background technique [0002] Infrared non-destructive testing has the advantages of fast detection speed, non-contact and strong versatility, so it is widely used in coating debonding detection, metal cracks and internal defect detection of various equipment. The size of the geometric feature of the defect determines whether the equipment can work normally and its service life. Therefore, it is of great significance to accurately obtain the geometric characteristics of defects. The principle of infrared non-destructive testing is to use the difference in heat transfer between defective and non-defective parts inside the device, resulting in different surface temperatures of the device, so as to determine the size of the internal defects of the device. [0003] A...

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Application Information

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IPC IPC(8): G01N25/72G01N29/04
CPCG01N25/72G01N29/04Y02P90/30
Inventor 郑虎李吉涂一航龙嘉威蔡林宏李恩
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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