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TWS earphone test system, method and device and computer readable storage medium

A test system and test method technology, applied in transmission systems, electrical components, etc., can solve problems such as reducing the test cost of TWS earphones, and achieve the effects of reducing data processing processes, saving manufacturing costs, and high compatibility

Pending Publication Date: 2022-05-17
TCL TECH ELECTRONICS (HUIZHOU) CO LTD
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  • Application Information

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Problems solved by technology

[0003] The main purpose of the present invention is to provide a TWS earphone testing system, method, equipment and computer-readable storage medium, aiming at solving the technical problem of how to reduce the testing cost of TWS earphones

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  • TWS earphone test system, method and device and computer readable storage medium
  • TWS earphone test system, method and device and computer readable storage medium
  • TWS earphone test system, method and device and computer readable storage medium

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Embodiment Construction

[0040] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0041] It should be noted that in the present invention, unless otherwise specified and limited, the terms "connection" and "fixation" should be understood in a broad sense. For example, "fixation" can be a fixed connection or a detachable connection, or a Integral; it may be mechanically connected or electrically connected; it may be directly connected or indirectly connected through an intermediary, and it may be the internal communication of two elements or the interaction relationship between two elements, unless otherwise clearly defined. Those of ordinary skill in the art can understand the s...

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Abstract

The invention discloses a TWS earphone test system, method and device and a computer readable storage medium, and belongs to the technical field of earphone test. When it is detected that the charging box receives the test data, whether the test data needs to be sent to the TWS earphone is determined, the test execution object is accurately determined, the data processing flow is reduced, the test efficiency is improved, after it is determined that the test data is sent to the TWS earphone, the test data is converted into the target data and sent to the TWS earphone, it is ensured that the TWS earphone can receive the data, and the test efficiency is improved. According to the invention, the TWS earphone is connected with the charging box, the loss of test data is avoided, after the feedback data fed back by the TWS earphone based on the target data is received, the feedback data is sent to the upper computer through the serial port board connected with the charging box, the test interaction is realized, the charging box paired with the TWS earphone is used for testing, a test rack does not need to be built, the test cost is effectively reduced, and the compatibility is relatively high; and the TWS earphone does not need to be additionally adapted, so that the manufacturing cost is greatly saved.

Description

technical field [0001] The present invention relates to the technical field of earphone testing, in particular to a TWS earphone testing system, method, device and computer-readable storage medium. Background technique [0002] With the development of science and technology, the use of electronic devices is becoming more and more convenient. Among them, TWS (True Wireless Stereo, True Wireless Stereo) earphones have attracted widespread attention because of their wireless and convenient use. In order to bring people a higher listening experience, a professional system test is required before the TWS earphones leave the factory to ensure the quality of the products on the line. At present, when the TWS headset is tested on the whole machine before leaving the factory, it is necessary to forward the instructions between the host computer and the headset to be tested through the manufacturing rack. The host computer sends the test command to the rack with a built-in specific co...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04R29/00H04L69/08
CPCH04R29/001H04L69/08
Inventor 赵于成陈智威隋昊梁东
Owner TCL TECH ELECTRONICS (HUIZHOU) CO LTD
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