Active three-dimensional reconstruction system and method based on linear structured light rotation scanning

A linear structured light and three-dimensional reconstruction technology, applied in the field of three-dimensional measurement, can solve the problems of large system calculation amount and increased system calibration complexity, and achieve the effects of small equipment size, avoiding mechanical jitter errors, and strong anti-noise and anti-interference.

Pending Publication Date: 2022-05-31
NANJING UNIV OF SCI & TECH
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AI Technical Summary

Problems solved by technology

Surface structured light can generate more information on the object surface at the same time, but the matching of multiple light bands will bring a huge amount of system calculation, and the complexity of system calibration will be greatly increased, and the overall workload of the system is much larger than that of the line structured light method.

Method used

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  • Active three-dimensional reconstruction system and method based on linear structured light rotation scanning
  • Active three-dimensional reconstruction system and method based on linear structured light rotation scanning
  • Active three-dimensional reconstruction system and method based on linear structured light rotation scanning

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Embodiment Construction

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[0090] In practice, the offset r can be

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[0097] In the acquisition device calibration step, the software part of the present invention identifies and extracts the situation as shown in Figure 6. exist

[0099] The basic principles, main features and advantages of the present invention have been shown and described above. Technicians in the industry should

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Abstract

The invention discloses an active three-dimensional reconstruction system and method based on linear structured light rotation scanning. The system comprises an image acquisition module, a rotary table motion module, a rotary table motion control module, an image processing module, a three-dimensional coordinate calculation module, a data transmission and reading module and a display module. The image acquisition module is arranged on the rotary table motion module, the rotary table motion module is connected with the rotary table motion control module, and the rotary table motion control module controls the rotary table motion module to rotate. The method can reconstruct and measure the three-dimensional shape information of the to-be-measured target, and has the characteristics of reasonable structure, high adaptability, high reconstruction precision and the like. Compared with a traditional three-dimensional reconstruction system based on a translation slide rail, the system adopts a rotary acquisition mode, so that the equipment size is smaller, the occupied space during operation is smaller, and a mechanical jitter error introduced in a traditional linear translation process can be effectively avoided.

Description

An active three-dimensional reconstruction system and method based on line structured light rotational scanning technical field The invention belongs to the technical field of three-dimensional measurement, particularly a kind of active three-dimensional measurement of rotary motion scanning and collection Measurement systems and methods. Background technique Compared with traditional measurement and detection methods, three-dimensional measurement technology has more advantages, and now it is used in product quality control, It is widely used in many fields such as automatic production and reverse technology. In recent years, thanks to computer, photoelectric, image processing With the vigorous development of technologies such as 3D measurement, there are more and more difficulties in technical implementation and theoretical analysis in the field of 3D measurement. It has been solved by the majority of researchers and scholars, which have given more development spa...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T17/00G06T7/80G01B11/24
CPCG06T17/00G06T7/80G01B11/24
Inventor 陈文建李子聿李武森
Owner NANJING UNIV OF SCI & TECH
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