Multistage super junction structure and self-alignment preparation method thereof

A self-alignment, super-junction technology, applied to semiconductor devices, electrical components, circuits, etc., can solve the problems of deep trench etching and low etching selection that are difficult to achieve super-junction, and achieve the effect of dynamic mask thickening , performance improvement, high verticality effect

Inactive Publication Date: 2022-06-21
ZHEJIANG UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For silicon carbide materials, the etching options under non-metallic masks are relatively low, and it is difficult to etch super-junction deep trenches. How to etch deep trenches with high aspect ratio and controllable sidewall inclination angles has become a challenge for this type of process. difficulty

Method used

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  • Multistage super junction structure and self-alignment preparation method thereof
  • Multistage super junction structure and self-alignment preparation method thereof
  • Multistage super junction structure and self-alignment preparation method thereof

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Embodiment Construction

[0030] figure 1 It is a flowchart of a self-aligned preparation method of a multilevel super junction structure according to an embodiment of the present invention. The flow of the self-aligned preparation method of the multilevel super junction structure may include step S1 to step SN+2, where N is a natural number greater than or equal to 2, or N is a natural number greater than or equal to 3.

[0031] In step S1, a first-level trench is etched using a first-level trench etching mask. The depth of the first-level groove is determined by the depth of the multi-level groove and the total number of stages, wherein the total number of stages is N.

[0032] Step S2, forming a first-level trench sidewall protective layer, and performing the first self-aligned etching using a second-level trench etching mask, the second-level trench etching mask including the first-level trench The trench sidewall protection layer and the first level trench etch mask.

[0033] Step S3, forming a...

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Abstract

The invention relates to a multistage super junction structure and a self-alignment preparation method thereof. The multi-stage super junction structure comprises an epitaxial layer and a multi-stage super junction column region, the multi-stage super junction column region comprises a plurality of single-stage column regions, the plurality of single-stage column regions correspond to a plurality of single-stage grooves, and the self-alignment preparation method of the multi-stage super junction structure comprises the following steps: growing a surface etching mask and forming a groove side wall protection layer for multiple times, and using the surface etching mask and the trench side wall protection layer to perform multiple times of self-alignment etching to form a multi-stage trench. According to the multistage super junction structure and the self-alignment preparation method thereof provided by the invention, the inclination angle of the side wall of the super junction groove can be regulated and controlled, and the influence caused by a side etching effect during deep groove etching can be effectively reduced in a manner of forming the side wall protection layer of the groove and then performing multistage etching; therefore, the super-junction deep groove is kept relatively high in perpendicularity, and the performance of a super-junction device is improved.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a multilevel super junction structure and a self-alignment preparation method thereof. Background technique [0002] In recent years, more and more attention has been paid to energy saving and emission reduction in the world, which puts forward higher requirements for loss control and efficiency improvement of large power electronic equipment. As an important part of power electronic equipment, semiconductor power devices have received extensive attention from the industry. Super junction devices can break through the one-dimensional theoretical performance limit of ordinary devices, and have great performance advantages and application potential in the medium and high voltage fields. [0003] The current mainstream super junction device manufacturing technology route includes multiple epitaxy and trench epitaxy backfilling processes. Among them, the super junction devic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/06
CPCH01L29/0634
Inventor 盛况王珩宇任娜程浩远柏松黄润华李士颜
Owner ZHEJIANG UNIV
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