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Method for segmentally measuring Isc and Voc of solar cell

A solar cell, segmented measurement technology, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve the problems of inaccurate value and inaccurate testing, and achieve the effect of improving accuracy

Pending Publication Date: 2022-07-08
无锡研谱智能科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Therefore, when the test object is a high-capacitance solar cell, or during the scanning process of the electronic load, there is an inaccurate value due to circuit problems, that is, Isc or Voc does not take the intersection point, and the problem of inaccurate testing will occur, such as figure 2 shown

Method used

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  • Method for segmentally measuring Isc and Voc of solar cell
  • Method for segmentally measuring Isc and Voc of solar cell
  • Method for segmentally measuring Isc and Voc of solar cell

Examples

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Embodiment 1

[0029] As a preferred solution of the present invention, the method is performed in the following order: firstly, the Voc measurement step is performed, then the Isc measurement step is performed, and finally the IV scan step is performed. like image 3 As shown, during 0-t1, when the circuit is in a true open-circuit state, the actual true value Voc is measured; during t1-t2, when the circuit is in a true short-circuit state, the actual true value Isc is measured; during t2-t3 time Inside, the electronic load scanning process is the IV scanning step, and the IV curve is obtained. pass image 3 It can be seen that even in the measurement process, the electronic load scan is incomplete and the curve is completed by fitting, which does not affect the true values ​​of Voc and Isc.

Embodiment 2

[0031] Specifically, as a preferred solution of the present invention, the method is performed in the following order: firstly, the Isc measurement step is performed, then the Voc measurement step is performed, and finally the IV scan step is performed. like Figure 4 As shown, during 0-t1, when the circuit is in a true short-circuit state, the actual true value Isc is measured; during t1-t2, when the circuit is in a true open-circuit state, the actual true Voc is measured; during t2-t3 time , the electronic load scanning process is the IV scanning step, and the IV curve is obtained. Even during the process, through image 3 It can be seen that even in the measurement process, the electronic load scan is incomplete and the curve is completed by fitting, which does not affect the true values ​​of Voc and Isc.

Embodiment 3

[0033] Specifically, as a preferred solution of the present invention, the method is performed in the following order: firstly, the Voc measurement step is performed, then the IV scanning step is performed, and finally the Isc measurement step is performed. like Figure 5 As shown in the figure, during 0-t1, the circuit is in a real open-circuit state, and the actual value Voc is measured; during t1-t2, the electronic load scans the process to obtain the IV curve; during t2-t3, the circuit is in a real state In the short-circuit state, the actual true value Isc is measured.

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Abstract

The invention discloses a method for measuring Isc and Voc of a solar cell in a segmented manner, the method is realized by separately carrying out an Isc measurement step, a Voc measurement step and an IV scanning step, and the Isc measurement step and the Voc measurement step are selectively carried out or are separately carried out according to any sequence; when one of the Isc measurement step and the Voc measurement step is selected to be carried out, the Isc measurement step or the Voc measurement step is firstly carried out, and finally the IV scanning step is carried out; when the Isc measurement step and the Voc measurement step are separately carried out according to any sequence, the Isc measurement step or the Voc measurement step is firstly carried out, and then the IV scanning step is carried out or finally the IV scanning step is carried out. According to the method, the Isc measurement step, the Voc measurement step and the IV scanning step are separately and independently carried out, the accurate values of the Isc and the Voc can be accurately measured, the IV curve is obtained through scanning, and the measurement accuracy of the electrical parameters of the solar cell can be greatly improved.

Description

technical field [0001] The invention relates to the technical field of solar cell testing, in particular to a method for segmentally measuring Isc and Voc of a solar cell. Background technique [0002] At present, the Isc and Voc values ​​of solar cells and components are obtained. After the forward scan (short-circuit state Isc to open-circuit state Voc) or reverse scan (open-circuit state Voc to short-circuit state Isc) is completed, two plotted curves are taken within a certain period of time. The points at the ends, Isc and Voc respectively, are used as the test values ​​of the solar cell to calculate the power, efficiency and other electrical parameters, such as figure 1 shown. [0003] With the improvement of solar cell efficiency, the method of fitting Isc and Voc in the IV measurement or the method of taking the IV curve and the intersection point is affected by the cell characteristics (such as capacitance effect) (not in the real open circuit, short circuit state)...

Claims

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Application Information

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IPC IPC(8): G01R31/36G01R31/378G01R31/382G01R31/389
CPCG01R31/36G01R31/378G01R31/382G01R31/389Y02E10/50
Inventor 魏明军
Owner 无锡研谱智能科技有限公司
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