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Probe life calibration method

A calibration method and probe technology, applied in measuring devices, instruments, measuring electrical variables, etc., can solve the problems of large friction damage to the probe, damage to the battery, and short life, so as to reduce consumption costs and avoid damage. Effect

Pending Publication Date: 2022-07-08
盐城阿特斯阳光能源科技有限公司 +1
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Problems solved by technology

Among them, the pressing parameters used in the test are recommended pressing parameters that have been calibrated by the manufacturer when the probe leaves the factory, but usually the downward pressure of the probe under this pressing parameter is relatively large, which may easily cause damage to the cell. In addition, the probe’s When the downforce is high, the friction damage of the probe is large, the number of cells that can be measured is small, and the calibrated life is short

Method used

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Embodiment Construction

[0046] In order to further illustrate the technical means and effects adopted by the present invention to achieve the predetermined purpose of the invention, the following describes the specific implementation, structure and characteristics of a probe life calibration method according to the present invention with reference to the accompanying drawings and preferred embodiments. and its efficacy, as detailed below.

[0047] The embodiment of the present invention provides a probe life calibration method, the calibration method includes:

[0048] Obtain the optimal probe shape variable;

[0049] Determine the probe pressing parameters according to the optimum probe deformation and the performance of the testing machine;

[0050] The probe life is calibrated under the probe pressing parameters using the testing machine.

[0051] The probe life calibration method provided by the embodiment of the present invention obtains the optimum probe deformation value, and then determines...

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Abstract

The invention discloses a probe life calibration method. According to the probe service life calibration method, the optimal probe deformation quantity is obtained, then the probe pressing parameters are determined according to the optimal probe deformation quantity and the performance of the test machine, and finally the probe service life is calibrated by adopting the test machine under the probe pressing parameters, so that the battery piece can be effectively prevented from being damaged, and the optimal service life of the probe can be better calibrated; and the consumption cost of the probe is reduced.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of detection equipment, and in particular, to a probe life calibration method. Background technique [0002] The probe is a test medium. During the test, the tip of the probe contacts the object to be tested, and the other end conducts a signal to test the electrical characteristics of the object to be tested. [0003] The life calibration method of the probe in the prior art is specifically as follows: after each test of a fixed number of cells, insert a repeatability test until the test result of the repeatability test exceeds the preset error range. The total number of completed cells is used as the probe life. Among them, the pressing parameters used in the test are the recommended pressing parameters that have been calibrated by the manufacturer when the probe leaves the factory. However, under these pressing parameters, the down pressure of the probe is usually large, which is ea...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
CPCG01R35/00
Inventor 杨金鑫何晓娟王丰彦唐正海浦云龙刘立兵王大鹏向宇宙
Owner 盐城阿特斯阳光能源科技有限公司