Impact overcurrent test device

Abstract

An impact over-current test device belongs to the field of impact over-current tests, is provided for solving the problem that one device cannot be directly connected to an instrument and connected to the instrument through a current transformer for short-time over-current tests, and comprises an impact current test side, an over-current test side, an ARM core control circuit, a 485, an Ethernet communication interface and a touch screen, the system comprises a bidirectional silicon controlled rectifier control circuit, an electrolytic capacitor energy storage / filter circuit, a cascade unidirectional silicon controlled rectifier control circuit, an impact current ADC charging acquisition circuit, an impact current ADC discharging acquisition circuit, a protection / discharging circuit, a DAC analog signal control circuit, a sine wave boost circuit, a current booster current rising circuit and an overcurrent ADC discharging acquisition circuit. An instrument can be directly connected and connected through a mutual inductor for testing, discharging time control is optimized, and safety of product discharging and diversity of control are improved.

Description

technical field [0001] The invention relates to the field of impulse overcurrent test, in particular to an impulse overcurrent test device. Background technique [0002] In order to improve the stability of the normal operation of the active electric energy meter, the national standard has launched a series of electric energy meter testing and test items, one of which requires a short-term overcurrent effect test on the active electric energy meter. For different types of meters, the standard requires different current indicators for short-term overcurrent to affect the test output. [0003] At present, the traditional short-time overcurrent influence test device has the following defects: [0004] (1) It is impossible to realize that one device can be directly connected to the instrument and connected to the instrument through the current transformer for short-term overcurrent test functions. For different types of instruments, the traditional test device is generally a di...

AI Technical Summary

Problems solved by technology

[0008] In order to overcome the defects in the above-mentioned prior art, the present invention provides an impulse overcurrent test device, which can solve the problem that in the prior art, it is impossible to realize that one device can be directly connected to the instrument at the same time, and connected to the instrument through a current transformer for short-term overcurrent testing. The problem of current test, the traditional test device is generally the problem of the control method of boosting the current of the manual rotary voltage regulator. For the control of the short-term overcurrent discharge time and the number of discharges, the traditional method needs to use an additional time relay device. , the problem that traditional test devices cannot be remotely controlled

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