Single-pixel image recognition system based on Van der Waals photoelectric detector
A photodetector and image recognition technology, applied in the field of image recognition of van der Waals photodetectors, can solve problems such as the inability to evaluate the stability and repeatability of van der Waals photodetectors
Active Publication Date: 2022-08-09
UNIV OF SCI & TECH BEIJING
View PDF13 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] However, the standard for evaluating van der Waals photodetectors is to analyze performance indicators such as responsivity, specific detectivity, spectral response, and response speed. The stability and repeatability of van der Waals photodetectors cannot be evaluated during use, and thus van der Waals photodetectors cannot be extended to imaging applications. imaging function
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0031] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0032] In order to make the above objects, features and advantages of the present invention more clearly understood, the present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments.
[0033] The single-pixel image recognition system based on van der Waals photodetector in this embodiment can perform fine scan imaging on 8mm*20mm images, such as figure 1 As shown in t...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention relates to a single-pixel image recognition system based on a Van der Waals photoelectric detector. The single-pixel image recognition system comprises an image microscopic positioning module, the Van der Waals photoelectric detector, a laser emission module, an image moving module, a signal acquisition module and an image processing module, the image microscopic positioning module is connected with the laser emission module, the Van der Waals photoelectric detector is connected with the signal acquisition module, and the image processing module is respectively connected with the image moving module and the signal acquisition module. According to the invention, the imaging function of the Van der Waals photoelectric detector is realized by setting the size of the pixel block and controlling the image to move, and the stability and repeatability of the Van der Waals photoelectric detector in practical application are evaluated in a limited manner in the repeated testing process.
Description
technical field [0001] The invention relates to the technical field of image recognition of van der Waals photodetectors, in particular to a single-pixel image recognition system based on van der Waals photodetectors. Background technique [0002] Photodetectors are widely used in various fields of military and national economy. Two-dimensional materials are considered as candidate materials for new types of photodetectors due to their ultra-thin thickness, tunable band gap and high mobility. Currently, two-dimensional materials are based on two-dimensional materials. The fabricated van der Waals photodetector exhibits good light detection capability. [0003] However, the standard for evaluating van der Waals photodetectors is to analyze performance indicators such as responsivity, specific detectivity, spectral response, and response speed. These indicators cannot evaluate the stability and repeatability of van der Waals photodetectors when they are actually used. , and t...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/28
CPCG01R31/2601G01R31/2825Y02E10/50
Inventor 张跃王玉南张铮张先坤于慧慧陈匡磊黄银洁张彦哲曹志宏何晓宇赵航
Owner UNIV OF SCI & TECH BEIJING