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Light strength distributing measuring method and apparatus thereof

A technology of light intensity distribution and measurement method, which is applied in the direction of measuring device, photometry, optical radiation measurement, etc., can solve the problems that the laser utilization efficiency and light spot size cannot be obtained correctly, and achieve the correct light spot size and correct utilization efficiency Effect

Inactive Publication Date: 2006-08-30
SANKYO SEIKI MFG CO LTD
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Problems solved by technology

[0010] However, conventionally, when the intensity distribution of laser light is obtained as a Gaussian distribution and compared with the actual measurement value, as image 3 As shown, the lower part of the light intensity distribution curve has an error of a few percent, and there is a problem that the laser utilization efficiency and the spot size cannot be obtained correctly.

Method used

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  • Light strength distributing measuring method and apparatus thereof
  • Light strength distributing measuring method and apparatus thereof
  • Light strength distributing measuring method and apparatus thereof

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Embodiment Construction

[0024] The light intensity distribution measuring method and the light intensity distribution measuring device using the present invention will be described with reference to the accompanying drawings.

[0025] figure 1 It is a structural diagram of the light intensity distribution measuring device. figure 2 A graph showing a comparison between the light intensity distribution calculated by the method of the present invention and the actual measurement value.

[0026] figure 1 The light intensity distribution measuring device 10 is a device for obtaining the light intensity distribution in the two-dimensional direction of the laser beam emitted by the semiconductor laser 11, and has: a light for measuring the light intensity of a plurality of parts of the laser beam emitted from the semiconductor laser 11 An intensity detection device 12; a data processing device 13 for calculating a light intensity distribution based on the light intensity detection result.

[0027] The l...

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Abstract

Provided is a light intensity distribution measuring method, capable of more accurately determining light intensity distribution of a laser luminous flux emitted from a semiconductor laser, and a device therefor. The light intensity distribution measuring device 10, measuring the light intensity distribution of the laser luminous flux emitted from the semiconductor laser 11, includes a light intensity detector 12 measuring light intensity of the laser luminous flux emitted from the semiconductor laser 11, at a predetermined position, and a data processor 13 calculating the light intensity distribution by applying measurement results in this light intensity detector 12 to a t-distribution function.

Description

technical field [0001] The present invention relates to a light intensity distribution measuring method and a light intensity distribution measuring device for measuring the intensity distribution of a laser beam emitted from a semiconductor laser. Background technique [0002] When constituting a laser optical system such as an optical head device for information reproduction and recording on optical recording media such as CDs and DVDs, and a fiber optic system, it is necessary to form a two-dimensional light intensity distribution of the laser beam emitted from the semiconductor laser. Calculate the utilization efficiency of light, or calculate the spot size near the focal point when focusing with an optical system. However, in order to obtain the two-dimensional light intensity distribution of the laser beam, it is necessary to measure the light intensity at a plurality of places, and to calculate the light intensity distribution using a predetermined probability density...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11B7/00G11B7/08G01J1/02G01J1/42H01S5/00
CPCG01J1/4257
Inventor 酒井博
Owner SANKYO SEIKI MFG CO LTD