Static force loading measuring and controlling equipment for material microstructure tester and its method

Abstract

A static loading device is placed on the microscope, a signal-collecting device is placed at the place of microscope oculr, said signal-collecting device is connected with image-collecting card, microprocessor and display in turn by means of conductive wire, said microprocessor is respectively connected with power supply and static loading device by means of conducting wire, its light source device is connected with power supply by means of conducting wire. Its control method includes the following steps: 1. starting; 2. regulating position of test piece, primary loading and applying light source; 3. collecting measuring signal, inputting said signal into image-collecting card and making A / D conversion and storage; and 4. calculating and processing measured data signal inputted by image collecting card by using microprocessor and making signal judgement.

Description

technical field [0001] The invention belongs to the category of instrument measurement, and in particular relates to a device and a control method for material microstatic force measurement. Background technique [0002] At present, for the development of new functional materials, nanomaterials, microelectronic devices, micromachines, and material mechanics, there is an urgent need for simple, reliable, non-contact testing, and testing functions such as displacement, deformation, stress, and rotation angle. Apparatus and methods. However, currently known instruments and control methods for measuring microstatic force of materials, on the one hand, use conventional microscopes, and stick test paper on the surface of the test piece for observation and measurement, but the observation effect is poor and the measurement accuracy is low. , cannot satisfy the subtle observation and precise measurement of the above materials. On the other hand, adva...

AI Technical Summary

Problems solved by technology

However, currently known instruments and control methods for measuring microstatic force of materials, on the one hand, use conventional microscopes, and stick test paper on the surface of the test piece for observation and measurement, but the observation effect is poor and the measurement accuracy is low. , cannot meet the needs of fine observation and precise measurement of the above materials

On the other hand, advanced, expensive, and various operating methods of electron microscopes are used, but due to the lack of measurement methods, it is also impossible to perform subtle observations and precise measurements on the microstructure of new functional materials, nanomaterials, and material mechanics. Materials, research and manufacture of new equipment have brought a lot of inconvenience and difficulties

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