Multiple-section synthesizing three-dimensional profile measuring method

A three-dimensional measurement, multi-section technology, applied in the direction of measuring devices, image data processing, image data processing, etc., can solve the problems of difficult measurement needs and high cost, and achieve the effect of improving the measurement speed

Inactive Publication Date: 2004-02-11
XIAN UNIV OF POSTS & TELECOMM +1
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Problems solved by technology

[0004] The three-dimensional measurement sensor of light section method is generally composed of light knife, camera and image acquisition device. The light knife image collected by the computer is processed to obtain the three-dimensional shape data of the measured object. The cross-sectional measurement speed of such a system is determined by the came

Method used

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  • Multiple-section synthesizing three-dimensional profile measuring method
  • Multiple-section synthesizing three-dimensional profile measuring method
  • Multiple-section synthesizing three-dimensional profile measuring method

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Embodiment Construction

[0019] Describe method and device of the present invention in detail below in conjunction with accompanying drawing:

[0020] Such as figure 1 As shown, the measured object 4 is placed on the transmission device 1, and the three-dimensional measurement sensor array 2 is placed above the transmission device 1 and the measured object 4, and the image acquisition and processing device 3 receives the image measurement data sent by the three-dimensional measurement sensor array 2, and data processing. Method of the present invention is realized according to the following steps:

[0021] 1) The transmission device 1 has a measurement reference plane for placing the measured object, and can move the measured object 4 at a constant speed V;

[0022] 2) Install the three-dimensional measurement sensor array 2 above the transmission device to ensure that the optical axis of the light knife of the three-dimensional measurement sensor is perpendicular to the measurement reference plane...

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Abstract

The multiple-section synthesizing 3D profile measuring method adopts a conveying unit to translate object to be measured in constant speed, several optically cutting 3D measuring sensors to constitute a 3D array for the measurement of the object, and a computer to synthesize the cross section data of the sensors to perform real-time in-situ measurement of 3D object profile sizes in doubled equivalent cross section measurement speed. The present invention may be used in the non-contact high-speed in-situ measurement of various object profile.

Description

1. Technical field [0001] The invention relates to the technical field of photoelectric detection, and further relates to a multi-section synthetic three-dimensional surface measurement method. 2. Background technology [0002] The line-structured light three-dimensional surface measurement method (also known as the light section method) is a non-contact photoelectric three-dimensional measurement technology. Such as figure 2 As shown, in this method, a line light source P (also known as a light knife) is vertically projected onto the surface A of the measured object, and the reflected image A' is used to measure the shape and surface geometry data of the object. The optical axis of the camera is clamped with the light knife P The angle is α, M is the measurement reference plane, L is the camera lens, extract the distance h′ between the center position of the light knife and the center of the image plane o’ from the reflected light knife image, and then use the principle of...

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Application Information

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IPC IPC(8): G01B11/24G06T1/00
Inventor 陈文艺蒋克俭姜涛李兵赵宏
Owner XIAN UNIV OF POSTS & TELECOMM
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