Multiple-section synthesizing three-dimensional profile measuring method

A three-dimensional measurement, multi-section technology, applied in the direction of measuring devices, image data processing, image data processing, etc., can solve the problems of difficult measurement needs and high cost, and achieve the effect of improving the measurement speed
CN1474160AInactive Publication Date: 2004-02-11XIAN UNIV OF POSTS & TELECOMM +1
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
XIAN UNIV OF POSTS & TELECOMM
Publication Date
2004-02-11
Estimated Expiration
Not applicable · inactive patent

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Abstract

The multiple-section synthesizing 3D profile measuring method adopts a conveying unit to translate object to be measured in constant speed, several optically cutting 3D measuring sensors to constitute a 3D array for the measurement of the object, and a computer to synthesize the cross section data of the sensors to perform real-time in-situ measurement of 3D object profile sizes in doubled equivalent cross section measurement speed. The present invention may be used in the non-contact high-speed in-situ measurement of various object profile.
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Description

1. Technical field

[0001] The invention relates to the technical field of photoelectric detection, and further relates to a multi-section synthetic three-dimensional surface measurement method. 2. Background technology

[0002] The line-structured light three-dimensional surface measurement method (also known as the light section method) is a non-contact photoelectric three-dimensional measurement technology. Such as figure 2 As shown, in this method, a line light source P (also known as a light knife) is vertically projected onto the surface A of the measured object, and the reflected image A' is used to measure the shape and surface geometry data of the object. The optical axis of the camera is clamped with the light knife P The angle is α, M is the measurement reference plane, L is the camera lens, extract the distance h′ between the center position of the light knife and the center of the image plane o’ from the reflected light knife image, and then use the principle of...

Claims

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