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Ultraviolet index monitor

A UV index and monitor technology, applied in the field of measurement, can solve the problems of difficult to control matching accuracy, difficult to guarantee measurement accuracy, difficult to filter out the spectrum, etc., so as to increase the reliability of the instrument, improve the measurement accuracy, and reduce the volume Effect

Inactive Publication Date: 2006-08-23
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI +1
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Generally, traditional ultraviolet measuring instruments use filters to match the erythema curve, which brings about a series of problems, such as the difficulty in controlling the matching accuracy, the use of multiple filters to increase the volume, and the difficulty of filtering certain spectra, etc. Difficult to guarantee measurement accuracy

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Embodiment Construction

[0035] The embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings, but the present embodiments are not intended to limit the present invention, and any similar structures and similar changes of the present invention should be included in the protection scope of the present invention.

[0036] see figure 1 As shown, a kind of ultraviolet index monitor that the embodiment of the present invention provides comprises:

[0037] A hardware circuit part, which consists of two parts, the head and the host, wherein,

[0038] A head part for receiving and amplifying ultraviolet signals and temperature signals; including:

[0039] A Schottky ultraviolet detector that can match the erythema response curve is connected to the input of the preamplifier circuit (OPA111);

[0040] A temperature sensor (AD590) is connected to the input end of the signal amplifier circuit (LF353);

[0041] The hardware circuit part also in...

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Abstract

This invention relates to an ultraviolet index monitor including a head part receiving and amplifying ultraviolet signals and temperature signals, in which, a Schottky UV-detector capable of matching with red spot response curve is connected with the input end of a preamplifier, a temperature sensor is connected with the input end of the signal amplifying circuit, the monitor also includes an A / D converting circuit of the host used in A / D conversion of signals connected with the outputs of the preamplifying circuit and the signal amplifying circuit of the head and a mono-chip control circuit finishing data process and temperature compensation connected with the output of the A / D conversion circuit and a display circuit displaying the tested UV-index in the way of color column, a soft program compares processed data and UV-index data scaled in advance and looks for the related temperature compensation data to get the final real time UV-index value and the temperature value to be sent to the LED lattice screen and the column color light to display them.

Description

technical field [0001] The invention relates to measurement technology, in particular to a measurement technology of ultraviolet index. Background technique [0002] Generally, traditional ultraviolet measuring instruments use filters to match the erythema curve, which brings about a series of problems, such as the difficulty in controlling the matching accuracy, the use of multiple filters to increase the volume, and the difficulty of filtering certain spectra, etc. Difficult to guarantee measurement accuracy. Furthermore, the requirements on the measuring circuit are reduced. Contents of the invention [0003] Aiming at the above-mentioned defects in the prior art, the technical problem to be solved by the present invention is to provide a small volume, high reliability, high measurement accuracy, convenient measurement, real-time monitoring and forecasting, and no filter UV index monitor. [0004] In order to solve the above technical problems, a UV index monitor pro...

Claims

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Application Information

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IPC IPC(8): G01J3/30
Inventor 庄松林瑚琦顾铃娟苏锦文王勇
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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