Method and system for early pass/fail determination

Abstract

A system for near-field measurement of a device under test in a far-field environment is provided. The system comprises a communication unit adapted to establish a far-field connection with the device under test. The system further comprises a measuring unit adapted to measure a magnitude and a phase of at least two field components. Moreover, the system comprises a processing unit adapted to perform far-field to near-field and / or near-field to near-field transformation of the field components in order to calculate field components at a specific surface in the near-field of the device under test.

Description

TECHNICAL FIELD[0001]The invention relates to early pass / fail determination in over the air (OTA) measurements, especially for three-dimensional (3D) spherical OTA measurements.BACKGROUND ART[0002]Generally, spherical OTA measurements require measurements over many measurement grid points, even up to several hundreds or thousands grid points, in order to get a final result. All measurement grid points are needed to be measured to assure that an amount of all measurement points is either above or below a certain limit or threshold. Such pass / fail type of tests are required for a wide variety of test procedures such as conformance tests, production tests etc. and the pass / fail criteria can be based on manufacturer's decision or can be set according to the communication standards. However, in order to cover all the measurement grid points, the device under test (DUT) is required to be repositioned inside the OTA chamber during the measurement.[0003]Furthermore, manual reposition of the...

AI Technical Summary

Benefits of technology

The patent text describes a method for reducing the time and resources needed for a measurement while maintaining high reliability. This is achieved by stopping the measurement early if certain conditions are met and reducing the number of measurement points needed to reach a verdict. Additionally, the use of an anechoic chamber can further improve measurement reliability by reducing standing waves.

Problems solved by technology

Furthermore, manual reposition of the DUT is also required in this case since several grid points are obstructed by the positioning system of the OTA chamber itself.

The repositioning of the DUT can introduce additional errors and issues with repeatability and reproducibility of the measurements as well as with the reliability of the measurement system.

Moreover, the measurements take a long time, especially when repositioning the DUT several times, depending on the number of measurement grid points and the required number of user interactions.

However, in the case of spherical OTA measurement, a reduction in the total number of measurement points drastically affects the measurement reliability.

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