Short circuit generator for testing power supplies

Abstract

The invention provides a system and method for generating a short circuit in a power supply during power supply reliability testing, where the short circuit generation system may be positioned internal to the computer chassis, and more particularly, may be connected to a computer bus system. The system uses the energy stored in a backup power supply to power the circuitry during the generation of the short circuit. That is, the energy is provided to a shorting circuitry connected to the output of the power supply, such that, the shorting circuitry is driven into linear mode for a predetermined duration roughly equal to the time required for the capacitors to discharge.

Description

[0001] 1. Field of the Invention[0002] This invention generally relates to power supplies, and more particularly, to a system which is capable of providing a short circuit to a power management system during power system reliability testing.[0003] 2. Description of the Related Art[0004] The growing demand for electronics and data processing systems is making it increasingly necessary for the electronics and data processing systems to be mass produced in large numbers. Typically, where the systems are mass produced, there exists a concern for making certain that the systems perform within accepted design parameters. One important aspect of the performance evaluation involves determining whether the system power supply will perform reliably when placed in the working environment (e.g. under load, or field conditions).[0005] One particular test known as a "short circuit test" is commonly performed on the power supply prior to leaving the manufacture. The test is used to determine wheth...

AI Technical Summary

Problems solved by technology

However, the exterior arrangement for performing the short circuit test is somewhat problematic in that the cables must be extremely thick in order to provide a low enough resistance for the power supply to interpret the signal provided by the cables as a short circuit.

Further, the relative thickness of the cables, in turn, tends to make using the external arrangement to short a power supply extremely cumbersome.

Further still, the switching of large currents in long thick cables may interfere with other test being formed simultaneously, such as, by creating an artificially generated electromagnetic field.

Also, since the power supplying the switching device typically must be maintained for the duration of the test, it cannot be drawn directly from the power supply under test.

As noted previously, however, the environment in which the short circuit test is performed is often very restrictive.

Consequently, it is undesirable to use an interior arrangement powered by a battery, since the testing environment in which the battery must operate often includes extreme effects of heat, chemicals, vibration, and shock, none of which can be withstood easily by the battery.

Therefore, the interior arrangement generally must draw power from an external source, which leaves the interior arrangement open to many of the same problems experienced by the exterior arrangement (e.g., noise and electromagnetic interference).

This is because conventional testing methods generally produce inconsistent short circuits resulting from short circuit generation systems which deliver inconsistent performance due to the restrictive and harsh testing environment.

Accordingly, presently known short circuit testing systems for computer chassis remain inadequate, particularly in their ability to accommodate the restrictive and sometimes harsh testing environment.

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