Contactless Memory Information Storage for Sample Analysis and Hand-Holdable Analyzer for Use Therewith

a sample analysis and memory information technology, applied in the field of electronic and chemical composition analyzers, can solve the problems of difficult to securely convey certifications or other information about analyzed materials when the materials change hands, take time to re-analyse the pieces and then move them to separate stockpiles, and require a large amount of real esta

Inactive Publication Date: 2009-03-05
THERMO NITON ANALYZERS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0016]The processor may be further programmed to control operation of the contactless memory dispenser so as to dis

Problems solved by technology

Re-analyzing the pieces and then moving the pieces to the separate stockpiles takes time.
Even if the pieces were originally segregated according to alloy, requiring a separate stockpile for each material composition requires a large amount of real estate, because each stockpile must be separat

Method used

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  • Contactless Memory Information Storage for Sample Analysis and Hand-Holdable Analyzer for Use Therewith
  • Contactless Memory Information Storage for Sample Analysis and Hand-Holdable Analyzer for Use Therewith
  • Contactless Memory Information Storage for Sample Analysis and Hand-Holdable Analyzer for Use Therewith

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Embodiment Construction

Description

[0033]The contents of US Provisional Patent Application No. 60 / 891,408, titled “Hand-Held, Self-Contained Optical Emission Spectroscopy (OES) Analyzer,” filed Feb. 23, 2007, and 60 / 889,465, titled “Small Spot X-Ray Fluorescence (XRF) Analyzer,” filed Feb. 12, 2007, are hereby incorporated by reference herein.

Storing Analytical Information in Association with an Analyzed Sample

[0034]In accordance with embodiments of the present invention, methods and apparatus are disclosed for storing information related to an analyzed substance (also referred to as a “sample” or, equivalently, as an “analyte”), such as a metal, soil, a plastic or a composite. The information may be stored in a contactless memory. The term “contactless memory,” as used herein, means that the memory, be it read-only or read / write, may be read without electrical contact with the memory and in some embodiments may be written without contact. Exemplary contactless memories include, without limitation: passive...

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Abstract

An analytical instrument stores and/or reads information related to a sample in a contactless memory, such as a passive or active radio-frequency identification (RF-ID) tag. The information may include information about: composition of the sample, one or more analytical instruments that were used to analyze the sample, operator(s) who used the instrument(s) to analyze the sample, user-entered data about the sample (such as an origin of the sample) or a combination thereof or the like. The memory may be attached to the sample or to a container, in which the sample is stored or transported. One or more copies of such a memory may be loosely stored with the sample, such as with soil in a plastic bag or a rail car. When the memory is attached to, or stored with, the sample, the sample becomes essentially self-documenting. Information about the sample, such as its composition or origin, may be read by a contactless memory reader, such as an RF-ID reader.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]This application claims the benefit of U.S. Provisional Patent Application No. 60 / 968,538, filed Aug. 28, 2007, titled “Contactless Memory Information Storage for Sample Analysis,” the entire contents of which are hereby incorporated by reference herein, for all purposes.TECHNICAL FIELD[0002]The present invention relates to elemental and chemical composition analyzers and, more particularly, to such analyzers that store and / or read information related to analyzed substances, instrument identification, operating conditions, and / or controlling parameters in contactless memories that may be physically associated with analyzed samples.BACKGROUND ART[0003]Portable and bench-top x-ray fluorescent (XRF), optical emission spectrographic (OES) and other analytical instruments are used throughout the world for determining elemental and chemical compositions of samples, such as metals, soils and plastics. In some cases, results of these analyses are...

Claims

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Application Information

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IPC IPC(8): G06K19/06G01J3/28G01N23/223H01J49/26G01J3/44
CPCG01N21/65G01N35/00732G01N2035/00326G06K7/0008G01N2035/00861G01N2223/0766G01N2223/301G01N2035/00841
Inventor DUGAS, MICHAEL E.HAMILTON, MARKMARTIN, KENNETH P.
Owner THERMO NITON ANALYZERS
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