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Communication unit with analog test unit

a communication unit and analog test technology, applied in the direction of transmission monitoring, line-transmission, electrical equipment, etc., can solve the problems general cost of test equipment, and achieve the effect of reducing the overall test tim

Inactive Publication Date: 2012-11-22
QUALCOMM INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

Significantly reduces testing time by enabling parallel testing of multiple receiver and transmitter chains, improving efficiency and reducing the need for costly ATE units with extensive interface pins.

Problems solved by technology

In many cases such test equipment is generally expensive and is optimized for the testing of digital rather than analog circuits.
In some embodiments, an analog test unit's ability to perform tests within the device (as opposed to externally—e.g., using the external test unit) may significantly reduce overall testing time, especially for multi-site testing where multiple receiver and transmitter chains on several chips can be tested in parallel.

Method used

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  • Communication unit with analog test unit
  • Communication unit with analog test unit
  • Communication unit with analog test unit

Examples

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Embodiment Construction

[0022]This specification includes references to “one embodiment” or “an embodiment.” The appearances of the phrases “in one embodiment” or “in an embodiment” do not necessarily refer to the same embodiment. Particular features, structures, or characteristics may be combined in any suitable manner consistent with this disclosure.

[0023]Terminology. The following paragraphs provide definitions and / or context for terms found in this disclosure, including the appended claims:

[0024]“Comprising.” This term is open-ended. As used in the appended claims, this term does not foreclose additional structure or steps. Consider a claim that recites: “A device, comprising an analog external interface . . . . ” Such a claim does not foreclose the apparatus from including additional components (e.g., a communication unit, an analog test unit, etc.).

[0025]“Configured.” As used herein, this term means that a particular piece of hardware or software is arranged to perform a particular task or tasks when...

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Abstract

Various devices and techniques for testing an analog portion of communication devices are disclosed. Such devices may include a communication unit and an analog test unit. The analog test unit may be configured to test analog portions of the communication unit and communicate information regarding testing to an external test unit. The analog test unit may also be configured to perform an analysis of a test signal that is output by a transmitter portion, looped back to a receiver portion, and subsequently received by the analog test unit. The analog test unit may also be configured to calibrate a DC offset of a receiver chain of the communication unit. The analog test unit may also be configured to perform a nonlinearity test on one or more ADCs and / or DACs of the communication unit.

Description

RELATED APPLICATIONS[0001]This application is a divisional of U.S. patent application Ser. No. 12 / 494,441, filed Jun. 30, 2009.TECHNICAL FIELD[0002]This disclosure relates generally to automated test equipment, and more specifically, to testing an analog portion of a communication unit.DESCRIPTION OF THE RELATED ART[0003]Automated test equipment (ATE) provides a quick and cost-efficient way for a computer system to test various aspects of electronic components. As a result, automated test equipment is frequently used in the semiconductor industry to test the integrity of integrated circuits after they are fabricated. In many cases such test equipment is generally expensive and is optimized for the testing of digital rather than analog circuits.SUMMARY[0004]Various embodiments of a device and methods for testing a device using an external test unit are disclosed. In one embodiment, a device may include a communication unit and an analog test unit. The communication unit may be config...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H04B17/00
CPCH04B17/0085H04B17/318H04B17/14
Inventor HUSTED, PAUL J.OZGUR, SONER
Owner QUALCOMM INC
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