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Semiconductor memory device and method of manufacturing the same

a memory device and semiconductor technology, applied in the direction of semiconductor devices, basic electric elements, electrical appliances, etc., can solve the problems of increasing the difficulty of manufacturing a structure in which insulation layers and conductive layers are alternately stacked, and the thickness of etching may not be uniform for each region, so as to improve the difficulty of process

Inactive Publication Date: 2014-06-05
SK HYNIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention aims to improve the manufacturing process of a semiconductor memory device by making it more difficult. The method of manufacturing the semiconductor memory device is also provided. This invention helps to make the device more challenging to create, but improves its overall quality and efficiency.

Problems solved by technology

Further, an etching thickness may be non-uniform for each region during a process of etching the conductive layer 51.
Due to the aforementioned problems, a level of difficulty of manufacturing a structure in which insulation layers and conductive layers are alternately stacked is increased.

Method used

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  • Semiconductor memory device and method of manufacturing the same
  • Semiconductor memory device and method of manufacturing the same
  • Semiconductor memory device and method of manufacturing the same

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Embodiment Construction

[0028]Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings in detail. However, the present invention is not limited to an embodiment disclosed below and may be implemented in various forms and the scope of the present invention is not limited to the following embodiments. Rather, the embodiment is provided to more sincerely and fully disclose the present invention and to completely transfer the spirit of the present invention to those skilled in the art to which the present invention pertains, and the scope of the present invention should be understood by the claims of the present invention.

[0029]FIG. 2 is a circuit diagram illustrating a semiconductor memory device according to first and second embodiments of the present invention.

[0030]Referring to FIG. 2, an exemplary semiconductor memory device may include a common source line CSL, a plurality of bit lines BL1 and LB2, and a plurality of cell strings CS11, CS12, CS21, ...

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Abstract

The present technology includes a semiconductor memory device, including a channel layer and interlayer insulation layers surrounding the channel layer. The interlayer insulation layers are stacked with a trench interposed therebetween. A seed pattern is formed on a surface of the trench and a metal layer is formed on the seed pattern in the trench.

Description

CROSS-REFERENCE TO RELATED APPLICATION[0001]This application is based on and claims priority from Korean Patent Application No. 10-2012-0137804, filed on Nov. 30, 2012, with the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference.BACKGROUND[0002]1. Field[0003]The present invention relates to a semiconductor memory device and a method of manufacturing the same, and more particularly, to a semiconductor memory device including alternately stacked Insulation layers and conductive layers, and a method of manufacturing the semiconductor memory device,[0004]2. Discussion of Related Art[0005]Various technologies capable of improving a degree of integration have been developed in a field of a semiconductor memory device. A 3D semiconductor memory device in which memory cells are three-dimensionally arranged on a substrate has been suggested as one of the technologies suggested for improvement of a degree of integration.[0006]FIGS....

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01L29/66H01L29/78H10B69/00H10B99/00
CPCH01L29/7827H01L29/66666H10B43/27H01L21/76224H01L21/823487H01L29/7926H10B41/27H01L21/28512
Inventor KWAK, SANG HYON
Owner SK HYNIX INC