Light irradiation type heat treatment apparatus

Abstract

A light diffusion plate made of quartz and provided with a plurality of recessed spherical surfaces is placed on an upper chamber window so as to be in opposed relation to a central portion of a semiconductor wafer. Flashes of light emitted from flash lamps and passing by the side of the light diffusion plate impinge upon a peripheral portion of the semiconductor wafer. On the other hand, flashes of light emitted from the flash lamps and entering the light diffusion plate are diverged by the recessed spherical surfaces. Part of the light entering the light diffusion plate is diffused toward the peripheral portion of the semiconductor wafer. As a result, this increases the amount of light impinging upon the peripheral portion of the semiconductor wafer, and decreases the amount of light impinging upon the central portion of the semiconductor wafer. Thus, the in-plane uniformity of an illuminance distribution on the semiconductor wafer is increased.

Description

BACKGROUND OF THE INVENTIONField of the Invention[0001]The present invention relates to a heat treatment apparatus which irradiates a thin plate-like precision electronic substrate (hereinafter referred to simply as a “substrate”) such as a semiconductor wafer with light to heat the substrate.Description of the Background Art[0002]In the process of manufacturing a semiconductor device, impurity doping is an essential step for forming a pn junction in a semiconductor wafer. At present, it is common practice to perform impurity doping by an ion implantation process and a subsequent annealing process. The ion implantation process is a technique for causing ions of impurity elements such as boron (B), arsenic (As) and phosphorus (P) to collide against the semiconductor wafer with high acceleration voltage, thereby physically implanting the impurities into the semiconductor wafer. The implanted impurities are activated by the subsequent annealing process. When annealing time in this anne...

AI Technical Summary

Benefits of technology

[0012]Part of the light entering the light diffusion plate is diffused toward a peripheral portion of the substrate. This increases the in-plane uniformity of an illuminance distribution on the substrate without wastefully consuming

Problems solved by technology

This results in a junction depth much greater than a required depth, which might constitute a hindrance to good device formation.

As a result, the in-plane distribution of illuminance becomes nonuniform, which in turn causes variations in temperature distribution.

However, such contrivance necessitates the adjustment of a large number of parts and set values.

It has been significantly difficult to attain the in-plane uniformity of the illuminance distribution meeting a required level.

The

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