Measuring method for polarized dependent loss PDL

A polarization-dependent loss and measurement method technology, which is applied in the direction of electromagnetic wave transmission system, electrical components, transmission system, etc., can solve problems such as unusable, and achieve the effect of simple feedback control scheme, simple and easy measurement scheme, and fast and effective measurement
CN100547953CActive Publication Date: 2009-10-07GUANGXUN SCI & TECH WUHAN

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
GUANGXUN SCI & TECH WUHAN
Publication Date
2009-10-07

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

This invention relates to a measurement method for PDL characterizing that: an incident modulated optical signal enters into a dual-refraction device to pass through a polarization rotor, a PDL device to be tested and enters into a polarization meter finally to let the rotor rotate a circle axially to note down the appeared DOP maximum value and the minimum value and compute the PDL value of related device, which is advantaged that it can measure PDL value in optical devices or system under single wavelength or multiple wave lengths and realize intelligent measurement to PDL without monitor.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to a method for measuring polarization-dependent loss (PDL), which is used for the PDL measurement of optical fiber communication devices and systems, and can realize the PDL characteristic measurement of optical devices and systems under the condition of single wavelength or multiple wavelengths. technical background

[0002] PDL is the ratio of the maximum and minimum transmitted optical power of an optical device or system in all polarization states. In the optical fiber communication system, the PDL of the optical device will cause the transmission signal to be distorted and finally cause the degradation of the system transmission performance. Therefore, PDL is crucial for the characterization of optical devices. Virtually every device exhibits a polarization-dependent transmission. Since the polarization of the transmitted signal is not confined within the fiber network, the insertion loss of the device varies with the pola...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More