Intelligent card test system and method

Abstract

The utility model provides a smart card test system and the method. The test system comprises a plurality of test cases compiled by advanced programming language, a judgment module, an input module for inputting test cases, an execution module that sends test orders to the smart card, a command library that receives orders from the execution module or the computer and stores a plurality of orders, a comparison module that compares the expected result with the executed result, and a display drive module and a memory module that display and store the comparison result. The test method comprises judging whether the smart card is connected successively; inputting the test cases to be tested; executing the content of the test cases, dispatching the orders in the command library to transfer the content of the test cases to APDU orders and send to the smart card; receiving the execution result returned by the smart card; comparing the executed result with the expected result to form the comparison result and storing and displaying the comparison result. The test system and the method of the utility model enable the compilation of test cases more flexible and allow the test system with better expansibility.

Description

technical field [0001] The invention relates to a smart card testing system and a method for testing smart cards using the smart card testing system. Background technique [0002] With the development of electronic technology, smart cards have been widely used in fields such as mobile communications, public transportation, and medical insurance. They are mainly used for fee settlement, data storage, and system management. Smart cards need to be tested before leaving the factory to detect whether the smart card can be used normally. [0003] Referring to Fig. 1, Fig. 1 is the schematic block diagram that existing smart card test system is connected with computer-related function library, computer in the figure is connected with card reader, smart card, and this figure is also the connection between smart card test system of the present invention and computer-related function library Schematic block diagram. The existing test system 10 is an application software running on t...

AI Technical Summary

Problems solved by technology

[0007] However, because the APDU sequence format used in writing test cases is fixed, only string comparison is supported, and functions such as variables, function definitions, loops, and selections are missing, which brings troubles to the writing of test cases

And testers cannot operate the card reader by writing test cases. The operation of the card reader is completely controlled by the test system. Once a new type of card reader

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