Unlock instant, AI-driven research and patent intelligence for your innovation.

Semiconductor storage apparatus and semiconductor integrated circuit incorporating the same

A technology for storage devices and integrated circuits, which is applied in semiconductor devices, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as loss of storage function, and achieve the effects of improving utilization efficiency, suppressing potential fluctuations, and high flexibility

Inactive Publication Date: 2008-05-21
PANASONIC CORP
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the aforementioned DRAM of the prior art, the potentials of the bit lines and the word lines connected to the memory cells used as bypass capacitors are fixed, so these memory cells completely lose their original storage function (storing bit information). ability)

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor storage apparatus and semiconductor integrated circuit incorporating the same
  • Semiconductor storage apparatus and semiconductor integrated circuit incorporating the same
  • Semiconductor storage apparatus and semiconductor integrated circuit incorporating the same

Examples

Experimental program
Comparison scheme
Effect test

no. 1 Embodiment approach

The semiconductor integrated circuit 100 according to the first embodiment of the present invention is preferably an LSI system, and has a power supply line 120, a logic circuit section 401, a memory control section 402, and a semiconductor storage device (hereinafter referred to as a "memory core section") 410 (Refer to Figure 4). The power supply line 120 is maintained at a constant power supply potential VDD, and supplies power to each part in the semiconductor integrated circuit 100. The logic circuit unit 401 is preferably a CPU system, and is connected to each unit in the semiconductor integrated circuit 100 by an internal bus. The logic circuit unit 401 executes various programs (refer to Figure 5 ) To control the operation of each part in the semiconductor integrated circuit 100.

[0012]

The memory control unit 402 is particularly connected to the memory core unit 410 by an internal bus, and is connected to an external memory M arranged outside the semiconductor integrate...

no. 2 Embodiment approach

The semiconductor integrated circuit according to the second embodiment of the present invention has the same structure as the semiconductor integrated circuit 100 according to the first embodiment of the present invention except for the inside of the memory block included in the memory core portion 410. For the details of these same constituent elements, reference is made to the description of the first embodiment and FIG. 4.

[0022]

The memory block 320 preferably has memory cells 301, word lines 110, 112, ..., bit lines 114, 115, 116, ..., selection signal lines 310, and third transistors 302, 303, 304, ... (refer to image 3 ). The memory cells 301 are preferably arranged in a lattice to form a memory cell array. The word lines 110, 112, ... extend laterally (in the row direction of the memory cell array) between the memory cells 301; the bit lines 114, 115, ... extend longitudinally (in the column direction of the memory cell array) between the memory cells 301. The selectio...

no. 3 Embodiment approach

The semiconductor integrated circuit according to the third embodiment of the present invention has the same structure as the semiconductor integrated circuit 100 according to the first embodiment of the present invention except for the selection signal line and the memory core portion 410. For details of these same constituent elements, reference is made to the description of the first embodiment and FIGS. 1 and 4.

[0027]

In the semiconductor integrated circuit according to the third embodiment of the present invention, unlike the semiconductor integrated circuit according to the first embodiment, a register 415 is provided inside the memory core portion 410 (see FIG. 6). Furthermore, instead of the selection signal lines 421, 422, 423, 424 (see FIG. 4) connected between the memory control unit 402 and the memory blocks of the memory core unit 410, the selection of the connection between the register 415 and each memory block Signal lines 431, 432, 433, 434. The memory control ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A semiconductor storage device, in which a selection signal line and a word line are arranged in parallel in each memory module in one-to-one correspondence. The states of pairs of adjacent word lines and select signal lines are maintained opposite to each other. In the memory module, the branches of the power line are arranged in parallel with each bit line in one-to-one correspondence. The first transistor in each memory cell connects the capacitor to the bit line according to the state of the word line. And, the second transistor connects the same capacitor to the branch of the power supply line according to the state of the selection signal line. In the memory cells arranged in the row direction, the gates of the first transistors are connected to the same word line, and the gates of the second transistors are connected to the same selection signal line. The number of memory cells used as bypass capacitors can be dynamically changed.

Description

Technical field [0001] The present invention relates to a semiconductor storage device, and more particularly to a semiconductor storage device mounted on a semiconductor integrated circuit. Background technique [0002] A dynamic semiconductor memory device (DRAM) is easy to be highly integrated and large-capacity. In recent years, DRAM (hybrid DRAM) integrated with logic circuits on the same chip has been widely used. Because the data transmission speed of the hybrid DRAM is extremely high, it is suitable for a system LSI (such as a graphic LSI) that performs high-speed calculation and communication of a large amount of data. On the other hand, compared with ordinary DRAM, the manufacturing process of hybrid DRAM is complicated. As a conventional technique for simplifying the manufacturing process of the hybrid DRAM, for example, the following technique has been widely known (for example, refer to Patent Document 1). In the DRAM using this prior art, a part of the memory cell...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/401H01L27/108H01L21/8242H01L27/10H10B12/00
CPCH01L27/1085G11C11/4074H01L27/101G11C11/4076H01L27/10882G11C11/404H10B12/03H10B12/48G11C5/063G11C7/18G11C8/14G11C11/4096
Inventor 高桥英治齐藤义行
Owner PANASONIC CORP